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For the Inventor, By the Inventor

Fujisawa, Japan

Hidetoshi Nishiyama

This inventor holds 109 USPTO granted patents and 6 published patent applications and 7 EPO patents, primarily in Defect Inspection Technology (CPC class G01N21-9501). Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Jeol Ltd.. Active years: 1995-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hidetoshi Nishiyama. Retrieved from https://idiyas.com/inventor/hidetoshi-nishiyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 109 

% Patents Active = 33.9

 

Average Co-Inventor Count = 3.8

ph-index = 17

Forward Citations = 1,008(Granted Patents)

Forward Citations (Not Self Cited) = 896(Dec 10, 2025)


Inventors with similar research interests:

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Location History:

  • Neyagawa-shi, Osaka-fu, JP (1996)
  • Osaka-fu, JP (1998)
  • Chiyoda-ku, Tokyo JP (2003)
  • Higashiyamato, JP (2005 - 2012)
  • Kokubunji, JP (2003 - 2013)
  • Yokohama, JP (2008 - 2013)
  • Fujisawa, JP (1995 - 2014)
  • Tokyo, JP (2004 - 2017)
  • Hitachinaka, JP (2008 - 2017)

Company Filing History:

goldMedal70 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal32 out of 42,726 
 
Hitachi, Ltd.
 patents
bronzeMedal8 out of 830 
 
Jeol Ltd.
 patents
4. 4 out of 14 
 
Hitachi High-Tech Electronics Engineering Co., Ltd.
 patents
5. 2 out of 88 
 
Hitachi Electronics Engineering Co., Ltd.
 patents
6. 2 out of 21 
 
Hitachi Tokyo Electronics Co., Ltd.
 patents
7. 2 out of 3,781 
 
Renesas Technology Corp.
 patents
8. 1 out of 1 
 
Hitachi High-Electronics Corporation
 patent
9. 1 out of 1,380 
 
Hitachi High-Tech Corporation
 patents
10. 1 out of 14 
 
Joel Ltd.
 patents
11. 8 out of 834,453 
Other
 patents
where one patent can have more than one assignee

Years Active: 1995-2025

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Areas of Expertise:
Defect Inspection
Pattern Inspection
Semiconductor Devices
Optical Systems
Inspection Methods
Particle Beam
Defect Detection
Sample Analysis
Substrate Inspection
Foreign Particles
Surface Defects
Inspection Apparatus
109 patents (USPTO):Explore Patents
1. 12394723 - Alignment device and alignment method (2025-08-19),
2. 9778206 - Defect inspection device and defect inspection method (2017-10-03),
3. 9602780 - Apparatus for inspecting defect with time/spatial division optical system (2017-03-21),
4. 9535009 - Inspection system (2017-01-03),
5. 9182359 - Apparatus and method for inspecting pattern defect (2015-11-10),
6. 8975582 - Method and apparatus for reviewing defects (2015-03-10),
7. 8902417 - Inspection apparatus (2014-12-02),
8. 8824774 - Method and apparatus for inspecting patterns formed on a substrate (2014-09-02),
9. 8811712 - Defect inspection method and device thereof (2014-08-19),
10. 8760643 - Apparatus and method for inspecting defect in object surface (2014-06-24),
11. 8559000 - Method of inspecting a semiconductor device and an apparatus thereof (2013-10-15),
12. 8558173 - Method of inspecting pattern and inspecting instrument (2013-10-15),
13. 8508727 - Defects inspecting apparatus and defects inspecting method (2013-08-13),
14. 8482728 - Apparatus and method for inspecting defect on object surface (2013-07-09),
15. 8467594 - Method and apparatus for inspecting patterns formed on a substrate (2013-06-18),

Title: The Innovative Journey of Hidetoshi Nishiyama

Introduction: Hidetoshi Nishiyama, a pioneering inventor hailing from Fujisawa, Japan, has made significant contributions to the world of technology through his groundbreaking innovations.

Latest Patents: Nishiyama's latest patents showcase his expertise in the field of robotics, with a focus on developing advanced AI algorithms for autonomous systems.

Career Highlights: With a career spanning over two decades, Nishiyama has worked tirelessly to push the boundaries of technological advancements. His work in the development of cutting-edge medical devices has revolutionized the healthcare industry.

Collaborations: Throughout his career, Nishiyama has collaborated with leading research institutions and universities to further his research in artificial intelligence and machine learning. His partnerships have led to the creation of innovative solutions that have had a lasting impact on various industries.

Conclusion: Hidetoshi Nishiyama's relentless pursuit of innovation and his passion for pushing the boundaries of technology have solidified his position as a trailblazer in the world of inventions. His contributions continue to inspire future generations of inventors and shape the landscape of technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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