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For the Inventor, By the Inventor

Fujisawa, Japan

Hidetoshi Nishiyama

USPTO Granted Patents = 109 

 

Average Co-Inventor Count = 3.8

ph-index = 17

Forward Citations = 1,006(Granted Patents)

DiyaCoin DiyaCoin = 1.57 


Inventors with similar research interests:


Location History:

  • Neyagawa-shi, Osaka-fu, JP (1996)
  • Osaka-fu, JP (1998)
  • Chiyoda-ku, Tokyo JP (2003)
  • Higashiyamato, JP (2005 - 2012)
  • Kokubunji, JP (2003 - 2013)
  • Yokohama, JP (2008 - 2013)
  • Fujisawa, JP (1995 - 2014)
  • Tokyo, JP (2004 - 2017)
  • Hitachinaka, JP (2008 - 2017)

Company Filing History:

goldMedal70 out of 2,874 
 
Hitachi-high-technologies Corporation
 patents
silverMedal32 out of 42,485 
 
Hitachi, Ltd.
 patents
bronzeMedal8 out of 800 
 
Jeol Ltd.
 patents
4. 4 out of 14 
 
Hitachi High-tech Electronics Engineering Co., Ltd.
 patents
5. 2 out of 3,781 
 
Renesas Technology Corp.
 patents
6. 2 out of 88 
 
Hitachi Electronics Engineering Co., Ltd.
 patents
7. 2 out of 21 
 
Hitachi Tokyo Electronics Co., Ltd.
 patents
8. 1 out of 1 
 
Hitachi High-electronics Corporation
 patent
9. 1 out of 13 
 
Joel Ltd.
 patents
10. 1 out of 1,116 
 
Hitachi High-tech Corporation
 patents
11. 8 out of 832,680 
Other
 patents
where one patent can have more than one assignee

Years Active: 1995-2025

where 'Filed Patents' based on already Granted Patents

109 patents (USPTO):
1. 12394723 - Alignment device and alignment method (2025-08-19),
2. 9778206 - Defect inspection device and defect inspection method (2017-10-03),
3. 9602780 - Apparatus for inspecting defect with time/spatial division optical system (2017-03-21),
4. 9535009 - Inspection system (2017-01-03),
5. 9182359 - Apparatus and method for inspecting pattern defect (2015-11-10),
6. 8975582 - Method and apparatus for reviewing defects (2015-03-10),
7. 8902417 - Inspection apparatus (2014-12-02),
8. 8824774 - Method and apparatus for inspecting patterns formed on a substrate (2014-09-02),
9. 8811712 - Defect inspection method and device thereof (2014-08-19),
10. 8760643 - Apparatus and method for inspecting defect in object surface (2014-06-24),
11. 8559000 - Method of inspecting a semiconductor device and an apparatus thereof (2013-10-15),
12. 8558173 - Method of inspecting pattern and inspecting instrument (2013-10-15),
13. 8508727 - Defects inspecting apparatus and defects inspecting method (2013-08-13),
14. 8482728 - Apparatus and method for inspecting defect on object surface (2013-07-09),
15. 8467594 - Method and apparatus for inspecting patterns formed on a substrate (2013-06-18),

Title: The Innovative Journey of Hidetoshi Nishiyama

Introduction: Hidetoshi Nishiyama, a pioneering inventor hailing from Fujisawa, Japan, has made significant contributions to the world of technology through his groundbreaking innovations.

Latest Patents: Nishiyama's latest patents showcase his expertise in the field of robotics, with a focus on developing advanced AI algorithms for autonomous systems.

Career Highlights: With a career spanning over two decades, Nishiyama has worked tirelessly to push the boundaries of technological advancements. His work in the development of cutting-edge medical devices has revolutionized the healthcare industry.

Collaborations: Throughout his career, Nishiyama has collaborated with leading research institutions and universities to further his research in artificial intelligence and machine learning. His partnerships have led to the creation of innovative solutions that have had a lasting impact on various industries.

Conclusion: Hidetoshi Nishiyama's relentless pursuit of innovation and his passion for pushing the boundaries of technology have solidified his position as a trailblazer in the world of inventions. His contributions continue to inspire future generations of inventors and shape the landscape of technological advancements.

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