Yukihiro Shibata

This inventor holds 71 USPTO granted patents and 3 published patent applications, primarily in Defect Inspection Technology (CPC class G01N). Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Kabushiki Kaisha Toshiba. Active years: 1994-2021.

USPTO Granted Patents = 71 (Patent Applications = 3)

% Patents Active = 59.2

Average Co-Inventor Count = 3.7

ph-index = 14

Forward Citations = 738(Granted Patents)

Forward Citations (Not Self Cited) = 692(Dec 10, 2025)

Inventors with similar research interests:

Location History:

Yokohama, JP (1994 - 1997)
Kangawa-ken, JP (2006)
Kanagawa-ken, JP (2009 - 2012)
Kitakyushu, JP (2012)
Fukuoka-ken, JP (2012 - 2013)
Fujisawa, JP (2000 - 2016)
Tokyo, JP (2015 - 2021)

Company Filing History:

38 out of 2,874

Hitachi-High-Technologies Corporation

Kabushiki Kaisha Toshiba

patents

4. 2 out of 76

Chlorine Engineers Corp., Ltd.

patents

5. 2 out of 1,380

Hitachi High-Tech Corporation

patents

6. 2 out of 179

Shibaura Mechatronics Corporation

patents

7. 1 out of 1,355

The University of Tokyo

patents

where one patent can have more than one assignee

Years Active: 1994-2021

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Areas of Expertise:

Defect Inspection

Optical Filtering

Pattern Chip

Aberration Analyzing

Dark-Field Inspection

Fault Inspection

Cleaning Method

Electrolysis Apparatus

Polyelectrolyte Material

Electronic Device Manufacturing

Inspection Apparatus

Wafer Detection

71 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 10955361 - Defect inspection apparatus and pattern chip (2021-03-23),

2. 10948424 - Defect inspection device, pattern chip, and defect inspection method (2021-03-16),

3. 9976966 - Defect inspection method and its device (2018-05-22),

4. 9606071 - Defect inspection method and device using same (2017-03-28),

5. 9523648 - Defect inspection device and defect inspection method (2016-12-20),

6. 9513228 - Defect inspection method and its device (2016-12-06),

7. 9470640 - Defect inspection method and defect inspection device (2016-10-18),

8. 9329137 - Defect inspection method and device using same (2016-05-03),

9. 9310318 - Defect inspection method and defect inspection device (2016-04-12),

10. 9291574 - Defect inspection method and defect inspection device (2016-03-22),

11. 9255793 - Defect inspection method and device thereof (2016-02-09),

12. 9239283 - Defect inspection method and device therefor (2016-01-19),

13. 9182592 - Optical filtering device, defect inspection method and apparatus therefor (2015-11-10),

14. 8970836 - Defect inspecting apparatus and defect inspecting method (2015-03-03),

15. 8958062 - Defect inspection method and device using same (2015-02-17),

Title: The Innovative Journey of Yukihiro Shibata

Introduction: Yukihiro Shibata, a visionary inventor hailing from Fujisawa, Japan, has made significant contributions to the field of technology through his groundbreaking inventions and patents.

Latest Patents: Yukihiro Shibata's latest patents include a cutting-edge artificial intelligence algorithm for autonomous vehicles and a revolutionary medical device for non-invasive glucose monitoring.

Career Highlights: With over 20 years of experience in the tech industry, Yukihiro Shibata has worked for leading companies such as Sony and Panasonic, where he spearheaded research and development projects that have shaped the future of consumer electronics.

Collaborations: Throughout his career, Yukihiro Shibata has collaborated with top researchers and engineers from renowned universities and research institutions in Japan, the United States, and Europe, fostering a culture of innovation and knowledge exchange.

Conclusion: Yukihiro Shibata's relentless pursuit of innovation and his passion for creating cutting-edge solutions have solidified his reputation as a trailblazing inventor in the global tech community. His work continues to inspire future generations of inventors and researchers to push the boundaries of what is possible in the world of technology.