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Hitachi Electronics Engineering Co., Ltd.

USPTO Granted Patents = 88

Forward Citations = 1,221

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167 inventors (with patents filed for the assignee):

Tetsuya Watanabe (8 out of 37 patents)

Hisayoshi Ichikawa (6 out of 6 patents)

Hiroyuki Suzuki (5 out of 103 patents)

4. Kyoichi Mori (5 out of 23 patents)

5. Yoshio Morishige (5 out of 22 patents)

6. Hisato Nakamura (5 out of 14 patents)

7. Takayuki Ishiguro (5 out of 5 patents)

8. Izuo Horai (4 out of 7 patents)

9. Kazuhiko Gommori (4 out of 4 patents)

10. Kenya Wada (4 out of 4 patents)

11. Hiroaki Machida (4 out of 4 patents)

12. Hideki Kambara (3 out of 98 patents)

13. Yoshihiko Hayashi (3 out of 39 patents)

14. Yasuo Yatsugake (3 out of 9 patents)

15. Takahisa Ishida (3 out of 4 patents)

Core Competencies:

Semiconductor Testing

Surface Defect Detection

DNA Sample Preparation

Magnetic Head Positioning

Interference Detection

Optical Systems

Electrophoresis Separation

Recording Media Libraries

IC Device Testing

Magnetic Disk Testing

Calibration Methods

Wafer Thickness Measurement

88 patents: Sort by Forward Citations

1. 8072597 - Method and its apparatus for inspecting particles or defects of a semiconductor device (2011-12-06),

2. 7499157 - System for monitoring foreign particles, process processing apparatus and method of electronic commerce (2009-03-03),

3. 7035039 - Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier and head cartridge (2006-04-25),

4. 6815198 - Apparatus for automated preparation of DNA samples and reactor for preparing DNA samples (2004-11-09),

5. 6790300 - Method and apparatus for bonding substrate plates together through gap-forming sealer material (2004-09-14),

6. 6661912 - Inspecting method and apparatus for repeated micro-miniature patterns (2003-12-09),

7. 6642734 - Method and apparatus to generate a ground level of a semiconductor IC tester having a plurality of substrates (2003-11-04),

8. 6631726 - Apparatus and method for processing a substrate (2003-10-14),

9. 6628402 - Phase interference detecting method and system in interferometer, and light detector therefor (2003-09-30),

10. 6617603 - Surface defect tester (2003-09-09),

11. 6600561 - Apparatus and method for measuring pattern alignment error (2003-07-29),

12. 6552535 - Defect detector circuit with a signal synthesizer and magnet disk certifier using the same defect detector circuit (2003-04-22),

13. 6515945 - Recording media library apparatus with a function to detect a position of a recording medium transferred in the library (2003-02-04),

14. 6515470 - Method and apparatus for testing IC device (2003-02-04),

15. 6509966 - Optical system for detecting surface defect and surface defect tester using the same (2003-01-21),

Hitachi Electronics Engineering Co., Ltd. is a subsidiary of the Hitachi Group, specializing in electrical engineering and manufacturing of electronic products. Established in 1972, the company provides a wide range of cutting-edge solutions including power systems, industrial equipment, and information technology products. With a commitment to innovation and quality, Hitachi Electronics Engineering has become a trusted global brand, serving diverse industries such as automotive, healthcare, energy, and more.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

88 Patents

#519 in Tokyo

#1,191 in Japan

#8,401 in the World

Hitachi Electronics Engineering Co., Ltd.

Forward Citations = 1,221

167 inventors:

Tetsuya Watanabe (8 out of 37 patents)

Hisayoshi Ichikawa (6 out of 6 patents)

Hiroyuki Suzuki (5 out of 103 patents)

4. Kyoichi Mori (5 out of 23 patents)

5. Yoshio Morishige (5 out of 22 patents)

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