For the Inventor, By the Inventor

Enter assignee name

Hitachi Electronics Engineering Co., Ltd.

USPTO Granted Patents = 88

% Expired Patents = 13.6

Forward Citations = 1,236

Loading Chart...

Loading Chart...

167 inventors (with patents filed for the assignee):

Tetsuya Watanabe (8 out of 37 patents)

Hisayoshi Ichikawa (6 out of 6 patents)

Hiroyuki Suzuki (5 out of 103 patents)

4. Kyoichi Mori (5 out of 23 patents)

5. Yoshio Morishige (5 out of 22 patents)

6. Hisato Nakamura (5 out of 14 patents)

7. Takayuki Ishiguro (5 out of 5 patents)

8. Izuo Horai (4 out of 7 patents)

9. Kazuhiko Gommori (4 out of 4 patents)

10. Kenya Wada (4 out of 4 patents)

11. Hiroaki Machida (4 out of 4 patents)

12. Hideki Kambara (3 out of 98 patents)

13. Yoshihiko Hayashi (3 out of 39 patents)

14. Yasuo Yatsugake (3 out of 9 patents)

15. Takahisa Ishida (3 out of 4 patents)

Core Competencies:

Semiconductor Testing

IC Tester

Defect Detection

Substrate Processing

Magnetic Disk Certifier

Surface Inspection

DNA Analyzer

Fluorescence Detector

Electrophoresis

Magnetic Head Positioning

Wafer Thickness Measuring

Calibration Method

88 patents: Sort by Forward Citations

1. 8072597 - Method and its apparatus for inspecting particles or defects of a semiconductor device (2011-12-06),

2. 7499157 - System for monitoring foreign particles, process processing apparatus and method of electronic commerce (2009-03-03),

3. 7035039 - Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier and head cartridge (2006-04-25),

4. 6815198 - Apparatus for automated preparation of DNA samples and reactor for preparing DNA samples (2004-11-09),

5. 6790300 - Method and apparatus for bonding substrate plates together through gap-forming sealer material (2004-09-14),

6. 6661912 - Inspecting method and apparatus for repeated micro-miniature patterns (2003-12-09),

7. 6642734 - Method and apparatus to generate a ground level of a semiconductor IC tester having a plurality of substrates (2003-11-04),

8. 6631726 - Apparatus and method for processing a substrate (2003-10-14),

9. 6628402 - Phase interference detecting method and system in interferometer, and light detector therefor (2003-09-30),

10. 6617603 - Surface defect tester (2003-09-09),

11. 6600561 - Apparatus and method for measuring pattern alignment error (2003-07-29),

12. 6552535 - Defect detector circuit with a signal synthesizer and magnet disk certifier using the same defect detector circuit (2003-04-22),

13. 6515945 - Recording media library apparatus with a function to detect a position of a recording medium transferred in the library (2003-02-04),

14. 6515470 - Method and apparatus for testing IC device (2003-02-04),

15. 6509966 - Optical system for detecting surface defect and surface defect tester using the same (2003-01-21),

Hitachi Electronics Engineering Co., Ltd. is a prominent player in the semiconductor testing industry, specializing in the development and manufacturing of advanced testing solutions. The company focuses on a range of core technologies including IC testers, defect detection systems, and substrate processing equipment. Additionally, Hitachi is involved in surface inspection technologies and tools for magnetic disk certification, as well as innovative devices like DNA analyzers and fluorescence detectors, contributing significantly to the semiconductor and electronics sectors from its headquarters in Tokyo, Japan.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Sep 29 2026

Hitachi Electronics Engineering Co., Ltd.

88 Patents

#590 in Tokyo

#1,218 in Japan

#8,668 in the World

Hitachi Electronics Engineering Co., Ltd.

Forward Citations = 1,236

167 inventors:

Tetsuya Watanabe (8 out of 37 patents)

Hisayoshi Ichikawa (6 out of 6 patents)

Hiroyuki Suzuki (5 out of 103 patents)

4. Kyoichi Mori (5 out of 23 patents)

5. Yoshio Morishige (5 out of 22 patents)

Please report any incorrect information to [email protected]

Loading…