The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2003

Filed:

Oct. 08, 1999
Applicant:
Inventors:

Tuneo Yamaba, Odawara, JP;

Hideo Ishimori, Ashigarakami-gun, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

In a phase interference detecting system with use of an interferometer, a height from a reference surface on a measurement surface is detected by receiving interference components of reflection lights from the reference surface and a measurement surface, which lights are divided from a laser beam and are modulated with a frequency being different therefrom, i.e., by irradiating only one laser beam. A light detector is constructed with a line type sensor for receiving the interference components of the reflection lights, and has a plurality of pixel groups for common use of a measurement surface and a plurality of pixel groups for exclusive use of a reference surface, which are provided at both thereof. A reference surface phase detecting means calculates a reference surface phase signal with respect to the pixels at a measurement point within the pixel group for common use of measurement surface, on a basis of an average value of signals of a predetermined number of pixel groups positioned at both sides in symmetric with respect to said measurement point. A measurement point phase calculating means calculates a measurement point phase signal of said reflection lights being incident upon the pixels at said measurement point on a basis of signals of the pixels at said measurement point. A height calculating means calculates out a signal corresponding to height of said measurement point by subtracting said reference surface phase signal from said measurement point phase signal.


Find Patent Forward Citations

Loading…