Kamisato-machi, Japan

Hisato Nakamura


Average Co-Inventor Count = 5.3

ph-index = 11

Forward Citations = 315(Granted Patents)


Location History:

  • Saitama-ken, JP (1997 - 1998)
  • Saitama, JP (1998)
  • Sitama-ken, JP (1999)
  • Kodama, JP (2002 - 2003)
  • Kamisato-machi, JP (2002 - 2011)

Company Filing History:


Years Active: 1997-2011

where 'Filed Patents' based on already Granted Patents

14 patents (USPTO):

Title: Innovator Spotlight: Hisato Nakamura

Introduction

Hisato Nakamura, an accomplished inventor based in Kamisato-machi, Japan, has made significant contributions to the field of defect detection and optical systems. With a portfolio of 14 patents, Nakamura has developed innovative methods and apparatuses that enhance the accuracy and efficiency of defect detection in various materials.

Latest Patents

Among his latest inventions is the "Method of Detecting Defects on an Object." This method employs an illumination optical unit that obliquely projects a laser focused onto a line on the surface of the object, alongside a white-color light. The system features a movable table unit for mounting specimens, a detection optical unit equipped with an image sensor to detect light reflected from the object, and a signal processor that extracts defect information. Additionally, the system incorporates an adjustable filter to block diffraction light resulting from patterns formed on the object.

Another noteworthy patent is the "Apparatus and Method for Testing Defects," which includes an illumination optical unit that projects laser light onto a specific region of the specimen's surface. The apparatus leverages an image sensor to detect light reflections, processing this data to extract defect information while the specimen remains mobile. A display unit presents the results, providing users with quickly accessible defect analysis.

Career Highlights

Throughout his career, Hisato Nakamura has honed his skills while working for prominent companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His experience in these leading organizations has undoubtedly informed his innovative approaches to optical technology and defect detection systems.

Collaborations

Nakamura has collaborated with several talented individuals in the field, including Tetsuya Watanabe and Yoshio Morishige. Together, their combined expertise has propelled advancements in technologies aimed at improving defect detection methods.

Conclusion

Hisato Nakamura's pioneering work in defect detection has positioned him as a prominent figure in the innovation landscape. His patents and collaborative efforts continue to inspire advancements in optical technology, showcasing the importance of innovation in enhancing production quality and efficiency across various industries.

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