Enter inventor name

Average Co-Inventor Count = 5.6

ph-index = 12

Forward Citations = 444(Granted Patents)

Location History:

Honjyo, JP (2003)
Honjo, JP (1997 - 2012)
Honjyou, JP (2005 - 2013)
Saitama, JP (1998 - 2023)

Company Filing History:

Hitachi-high-technologies Corporation

patents

8 out of 88

Hitachi Electronics Engineering Co., Ltd.

patents

4. 5 out of 631

Nihon Dempa Kogyo Co., Ltd.

patents

5. 4 out of 14

Hitachi High-tech Electronics Engineering Co., Ltd.

patents

6. 1 out of 1

Hitachi High-electronics Corporation

patent

7. 2 out of 832,843

Other

patents

where one patent can have more than one assignee

Years Active: 1997-2024

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37 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12101075 - Piezoelectric device and manufacturing method of the same (2024-09-24),

2. 11824516 - Piezoelectric device and manufacturing method of the same (2023-11-21),

3. 11296275 - Piezoelectric device, piezoelectric vibrating piece, and method for manufacturing piezoelectric vibrating piece (2022-04-05),

4. 10840882 - Crystal unit and manufacturing method thereof (2020-11-17),

5. 10819307 - Crystal unit and manufacturing method thereof (2020-10-27),

6. 8559000 - Method of inspecting a semiconductor device and an apparatus thereof (2013-10-15),

7. 8274651 - Method of inspecting a semiconductor device and an apparatus thereof (2012-09-25),

8. 8254662 - System for monitoring foreign particles, process processing apparatus and method of electronic commerce (2012-08-28),

9. 8045148 - System for monitoring foreign particles, process processing apparatus and method of electronic commerce (2011-10-25),

10. 8040503 - Method of inspecting a semiconductor device and an apparatus thereof (2011-10-18),

11. 7692779 - Apparatus and method for testing defects (2010-04-06),

12. 7643138 - Method of inspecting a semiconductor device and an apparatus thereof (2010-01-05),

13. 7639350 - Apparatus and method for testing defects (2009-12-29),

14. 7511806 - Apparatus and method for inspecting defects (2009-03-31),

15. 7499157 - System for monitoring foreign particles, process processing apparatus and method of electronic commerce (2009-03-03),

Title: The Innovative Journey of Tetsuya Watanabe

Introduction: Tetsuya Watanabe, a distinguished inventor hailing from Honjo, Japan, has made significant contributions to the field of technology through his groundbreaking innovations.

Latest Patents: Tetsuya Watanabe holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Watanabe has worked with leading research institutions and tech companies, consistently pushing the boundaries of what is possible in the realm of innovation.

Collaborations: Throughout his career, Tetsuya Watanabe has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of creativity and excellence in all his projects.

Conclusion: Tetsuya Watanabe's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and visionaries worldwide.

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