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For the Inventor, By the Inventor

Honjo, Japan

Tetsuya Watanabe

This inventor holds 37 USPTO granted patents, primarily in Semiconductor Inspection. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Hitachi Electronics Engineering Co., Ltd.. Active years: 1997-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tetsuya Watanabe. Retrieved from https://idiyas.com/inventor/tetsuya-watanabe-7vwjo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 37

% Patents Active = 48.6

Average Co-Inventor Count = 5.6

ph-index = 12

Forward Citations = 444(Granted Patents)


Location History:

  • Honjyo, JP (2003)
  • Honjo, JP (1997 - 2012)
  • Honjyou, JP (2005 - 2013)
  • Saitama, JP (1998 - 2023)

Company Filing History:

goldMedal17 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal17 out of 42,731 
 
Hitachi, Ltd.
 patents
bronzeMedal8 out of 88 
 
Hitachi Electronics Engineering Co., Ltd.
 patents
4. 5 out of 631 
 
Nihon Dempa Kogyo Co., Ltd.
 patents
5. 4 out of 14 
 
Hitachi High-Tech Electronics Engineering Co., Ltd.
 patents
6. 1 out of 1 
 
Hitachi High-Electronics Corporation
 patent
7. 2 out of 834,513 
Other
 patents
where one patent can have more than one assignee

Years Active: 1997-2024

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Areas of Expertise:
Piezoelectric Device
Crystal Unit
Semiconductor Inspection
Defect Testing
Foreign Particles
Quality Control
Manufacturing Method
Inspection Apparatus
Extraneous Substance
Vibrating Piece
Micro-Miniature Patterns
Shading Correction
37 patents (USPTO):Explore Patents
1. 12101075 - Piezoelectric device and manufacturing method of the same (2024-09-24),
2. 11824516 - Piezoelectric device and manufacturing method of the same (2023-11-21),
3. 11296275 - Piezoelectric device, piezoelectric vibrating piece, and method for manufacturing piezoelectric vibrating piece (2022-04-05),
4. 10840882 - Crystal unit and manufacturing method thereof (2020-11-17),
5. 10819307 - Crystal unit and manufacturing method thereof (2020-10-27),
6. 8559000 - Method of inspecting a semiconductor device and an apparatus thereof (2013-10-15),
7. 8274651 - Method of inspecting a semiconductor device and an apparatus thereof (2012-09-25),
8. 8254662 - System for monitoring foreign particles, process processing apparatus and method of electronic commerce (2012-08-28),
9. 8045148 - System for monitoring foreign particles, process processing apparatus and method of electronic commerce (2011-10-25),
10. 8040503 - Method of inspecting a semiconductor device and an apparatus thereof (2011-10-18),
11. 7692779 - Apparatus and method for testing defects (2010-04-06),
12. 7643138 - Method of inspecting a semiconductor device and an apparatus thereof (2010-01-05),
13. 7639350 - Apparatus and method for testing defects (2009-12-29),
14. 7511806 - Apparatus and method for inspecting defects (2009-03-31),
15. 7499157 - System for monitoring foreign particles, process processing apparatus and method of electronic commerce (2009-03-03),

Title: The Innovative Journey of Tetsuya Watanabe

Introduction: Tetsuya Watanabe, a distinguished inventor hailing from Honjo, Japan, has made significant contributions to the field of technology through his groundbreaking innovations.

Latest Patents: Tetsuya Watanabe holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Watanabe has worked with leading research institutions and tech companies, consistently pushing the boundaries of what is possible in the realm of innovation.

Collaborations: Throughout his career, Tetsuya Watanabe has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of creativity and excellence in all his projects.

Conclusion: Tetsuya Watanabe's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and visionaries worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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