logo

For the Inventor, By the Inventor

Tokyo, Japan

Hitachi High-electronics Corporation


USPTO Granted Patents = 1

Forward Citations = 12

Loading Chart...
Loading Chart...

5 inventors (with patents filed for the assignee):

goldMedal Akira Hamamatsu (1 out of 84 patents)

silverMedal Hidetoshi Nishiyama (1 out of 109 patents)

bronzeMedal Minori Noguchi (1 out of 113 patents)

4.  Yoshimasa Ooshima (1 out of 9 patents)

5.  Tetsuya Watanabe (1 out of 37 patents)


1 patent:

1. 7187438 - Apparatus and method for inspecting defects (2007-03-06),
logo

Company Badge

USPTO Data Jan 1 1976 - Dec 23 2025

1 Patents

#5,735 in Tokyo

#15,539 in Japan

...
Tokyo, Japan

Hitachi High-electronics Corporation

Forward Citations = 12

5 inventors:

goldMedal Akira Hamamatsu (1 out of 84 patents)

silverMedal Hidetoshi Nishiyama (1 out of 109 patents)

bronzeMedal Minori Noguchi (1 out of 113 patents)

4.  Yoshimasa Ooshima (1 out of 9 patents)

5.  Tetsuya Watanabe (1 out of 37 patents)

Please report any incorrect information to support@idiyas.com
Loading…