For the Inventor, By the Inventor

Enter assignee name

Hitachi High-Tech Electronics Engineering Co., Ltd.

USPTO Granted Patents = 14

% Expired Patents = 71.4

Forward Citations = 160

Loading Chart...

Loading Chart...

56 inventors (with patents filed for the assignee):

Minori Noguchi (6 out of 113 patents)

Akira Hamamatsu (4 out of 84 patents)

Hidetoshi Nishiyama (4 out of 109 patents)

4. Tetsuya Watanabe (4 out of 37 patents)

5. Yoshimasa Ohshima (3 out of 53 patents)

6. Kenya Wada (3 out of 9 patents)

7. Kenji Watanabe (3 out of 41 patents)

8. Takahiro Jingu (2 out of 66 patents)

9. Jun Onoshiro (2 out of 4 patents)

10. Aritoshi Sugimoto (1 out of 45 patents)

11. Norio Chujo (1 out of 42 patents)

12. Takanori Ninomiya (1 out of 64 patents)

13. Yoshihiko Hayashi (1 out of 39 patents)

14. Kenji Oka (1 out of 42 patents)

15. Masayoshi Takahashi (1 out of 63 patents)

14 patents: Sort by Forward Citations

1. 7586593 - Inspection method and inspection apparatus (2009-09-08),

2. 7511806 - Apparatus and method for inspecting defects (2009-03-31),

3. 6944325 - Inspecting method and apparatus for repeated micro-miniature patterns (2005-09-13),

4. 6936835 - Method and its apparatus for inspecting particles or defects of a semiconductor device (2005-08-30),

5. 6911101 - ACF tape feeder machine, and method for feeding ACF tape (2005-06-28),

6. 6897956 - Apparatus and method for measuring alignment accuracy, as well as method and system for manufacturing semiconductor device (2005-05-24),

7. 6894489 - TESTING APPARATUS FOR CONDUCTING A TEST ON A MAGNETIC RECORDING MEDIUM OR A MAGNETIC HEAD, THROUGH RECORDING TEST DATA ON THE MAGNETIC RECORDING MEDIUM AND REPRODUCING RECORDED TEST DATA THEREFROM BY MEANS OF THE MAGNETIC HEAD (2005-05-17),

8. 6894302 - Surface inspection apparatus and method thereof (2005-05-17),

9. 6893329 - Polishing apparatus with abrasive tape, polishing method using abrasive tape and manufacturing method for magnetic disk (2005-05-17),

10. 6888959 - Method of inspecting a semiconductor device and an apparatus thereof (2005-05-03),

11. 6888918 - Surface inspection method and surface inspection apparatus (2005-05-03),

12. 6887330 - Machine for punching out electronic circuitry parts, method for replacing tape supply reels, and method for producing electronic circuitry parts from tape (2005-05-03),

13. 6821906 - Method and apparatus for treating surface of substrate plate (2004-11-23),

14. 6798504 - Apparatus and method for inspecting surface of semiconductor wafer or the like (2004-09-28),

Company Overview

Hitachi High-Tech Electronics Engineering Co., Ltd. specializes in advanced electronic systems and components, focusing on high-tech solutions for various industries. The company is known for its expertise in semiconductor manufacturing equipment, analytical instruments, and precision measurement technologies. With a strong emphasis on innovation, Hitachi High-Tech plays a crucial role in enhancing productivity and efficiency across sectors such as electronics, healthcare, and materials science, contributing to technological advancements on a global scale.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

14 Patents

#1,596 in Tokyo

#3,577 in Japan

#42,199 in the World

Hitachi High-Tech Electronics Engineering Co., Ltd.

Forward Citations = 160

56 inventors:

Minori Noguchi (6 out of 113 patents)

Akira Hamamatsu (4 out of 84 patents)

Hidetoshi Nishiyama (4 out of 109 patents)

4. Tetsuya Watanabe (4 out of 37 patents)

5. Yoshimasa Ohshima (3 out of 53 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hitachi High-Tech Electronics Engineering Co., Ltd.. Retrieved from https://idiyas.com/company/hitachi-high-tech-electronics-engineering-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…