Yokohama, Japan

Yoshimasa Ohshima

USPTO Granted Patents = 53 

Average Co-Inventor Count = 5.8

ph-index = 18

Forward Citations = 896(Granted Patents)

DiyaCoin DiyaCoin 0.18 


Inventors with similar research interests:


Location History:

  • Yokohamai, JP (2010 - 2012)
  • Yokohama, JP (1984 - 2013)

Company Filing History:


Years Active: 1984-2013

where 'Filed Patents' based on already Granted Patents

53 patents (USPTO):

Title: Innovations and Contributions of Yoshimasa Ohshima

Introduction

Yoshimasa Ohshima, a prominent inventor based in Yokohama, Japan, has made significant contributions to the field of semiconductor inspection technology. With an impressive portfolio of 53 patents, Ohshima's work has paved the way for advancements in how semiconductor devices are inspected and analyzed, enhancing the overall performance and reliability of these essential components.

Latest Patents

Among his latest innovations is a patent for a method of inspecting a semiconductor device and an apparatus thereof. This invention involves a comprehensive method and apparatus that inspects a sample under various conditions. Inspection data is collected, and position information on the sample is recorded in correspondence with each inspection condition. This approach allows for detailed analysis of the sample by comparing inspection data, leading to the identification of specific positions that require closer examination. Additionally, Ohshima holds a patent for a defects inspecting apparatus and method, which features two illuminating units that use different incident angles. This inventive setup is paired with detecting optical units positioned at varying elevation angles, enabling efficient image capture of the specimen's surface.

Career Highlights

Yoshimasa Ohshima has had a distinguished career, particularly with organizations such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His work in these companies has focused on advancing technologies that play a crucial role in the semiconductor industry. Ohshima's innovations reflect a deep understanding of semiconductor technologies and inspection methodologies, reinforcing his reputation as a leader in his field.

Collaborations

Throughout his career, Ohshima has collaborated with notable individuals like Minori Noguchi and Hidetoshi Nishiyama. These collaborations have fostered a dynamic exchange of ideas and expertise, contributing to the development of cutting-edge inspection technologies.

Conclusion

Yoshimasa Ohshima's extensive patent portfolio and innovative contributions stand as a testament to his dedication and expertise in semiconductor inspection technology. His latest inventions not only demonstrate his technical acumen but also highlight the critical role inventors play in pushing the boundaries of technology forward. As he continues to innovate, the impact of his work will undoubtedly benefit the semiconductor industry and beyond.

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