Enter inventor name

Average Co-Inventor Count = 4.4

ph-index = 12

Forward Citations = 489(Granted Patents)

Location History:

Fujisawa, JP (1998 - 2008)
Kanagawa-ken, JP (2006 - 2013)
Hitachinaka, JP (2005 - 2015)
Yokohama, JP (2000 - 2018)

Company Filing History:

Hitachi-high-technologies Corporation

patents

6 out of 4,154

Lenovo (singapore) Pte. Ltd.

patents

4. 3 out of 3,781

Renesas Technology Corp.

patents

5. 1 out of 14

Hitachi High-tech Electronics Engineering Co., Ltd.

patents

6. 1 out of 164,197

International Business Machines Corporation

patents

where one patent can have more than one assignee

Years Active: 1998-2018

Loading Chart...

Areas of Expertise:

Backup File Integrity

Operating Environment Switching

Operating System Management

Surface Inspection Apparatus

Biometric Information Association

Semiconductor Device Inspection

Defect Inspection Method

2D Image Capture

Inspection Data Processing

Power Consumption Reduction

Automatic Focus Detection

Manufacturing Method of Semiconductor Substrate

42 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 10032029 - Verifying integrity of backup file in a multiple operating system environment (2018-07-24),

2. 9910677 - Operating environment switching between a primary and a secondary operating system (2018-03-06),

3. 9753739 - Operating system management of second operating system (2017-09-05),

4. 9483278 - Arrangement for secure independent operating environments in a computer (2016-11-01),

5. 8949043 - Surface inspecting apparatus and method for calibrating same (2015-02-03),

6. 8831899 - Inspecting apparatus and an inspecting method (2014-09-09),

7. 8804108 - Inspection method and inspection apparatus (2014-08-12),

8. 8699017 - Appearance inspection apparatus (2014-04-15),

9. 8559000 - Method of inspecting a semiconductor device and an apparatus thereof (2013-10-15),

10. 8539248 - Associating biometric information with passwords (2013-09-17),

11. 8462327 - Appearance inspection apparatus (2013-06-11),

12. 8274651 - Method of inspecting a semiconductor device and an apparatus thereof (2012-09-25),

13. 8169606 - Appearance inspection apparatus (2012-05-01),

14. 8107717 - Defect inspection method and apparatus (2012-01-31),

15. 8040503 - Method of inspecting a semiconductor device and an apparatus thereof (2011-10-18),

Title: Kenji Oka - Innovative Inventor from Yokohama

Introduction: Kenji Oka is a renowned inventor hailing from Yokohama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Kenji Oka holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous dedication to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Kenji Oka has worked with leading tech companies and research institutions, spearheading projects that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout his career, Kenji Oka has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and knowledge-sharing that has led to numerous successful projects and inventions.

Conclusion: Kenji Oka's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor, inspiring the next generation of innovators to push the limits of what is possible in the world of technology.

This text is generated by artificial intelligence and may not be accurate.

Please report any incorrect information to support@idiyas.com