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For the Inventor, By the Inventor

Takasaki, Japan

Takahiro Jingu

This inventor holds 66 USPTO granted patents and 10 published patent applications, primarily in Defect Inspection Technology (CPC class G01N). Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Hitachi Electronics Engineering Co., Ltd.. Active years: 1999-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahiro Jingu. Retrieved from https://idiyas.com/inventor/takahiro-jingu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 66 

% Patents Active = 57.6

Average Co-Inventor Count = 3.5

ph-index = 12

Forward Citations = 507(Granted Patents)

Forward Citations (Not Self Cited) = 470(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Takasaki, JP (1999 - 2019)
  • Tokyo, JP (2004 - 2020)

Company Filing History:

goldMedal58 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal15 out of 42,743 
 
Hitachi, Ltd.
 patents
bronzeMedal2 out of 88 
 
Hitachi Electronics Engineering Co., Ltd.
 patents
4. 2 out of 14 
 
Hitachi High-Tech Electronics Engineering Co., Ltd.
 patents
5. 1 out of 1,398 
 
Hitachi High-Tech Corporation
 patents
6. 2 out of 834,601 
Other
 patents
where one patent can have more than one assignee

Years Active: 1999-2020

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Areas of Expertise:
Defect Inspection
Low Light Detection
Surface Measurement
Charged Particle Beam
Inspection Apparatus
Photoelectric Conversion
Contamination Inspection
Semiconductor Devices
Image Capture
Spatial Division Optical System
Examination Method
Calibration Techniques
66 patents (USPTO):Explore Patents
1. 10818471 - Charged particle beam device (2020-10-27),
2. 10444011 - Sample for coordinates calibration and method for fabricating the same (2019-10-15),
3. 10261026 - Defect inspection method, low light detecting method, and low light detector (2019-04-16),
4. 9885670 - Inspection apparatus and adjusting method (2018-02-06),
5. 9823065 - Surface measurement apparatus (2017-11-21),
6. 9791380 - Inspection device and image capture element (2017-10-17),
7. 9779912 - Inspection device and measurement device (2017-10-03),
8. 9759669 - Inspection device (2017-09-12),
9. 9645094 - Defect inspection device and defect inspection method (2017-05-09),
10. 9602780 - Apparatus for inspecting defect with time/spatial division optical system (2017-03-21),
11. 9588054 - Defect inspection method, low light detecting method and low light detector (2017-03-07),
12. 9568439 - Defect inspection device and defect inspection method (2017-02-14),
13. 9568437 - Inspection device (2017-02-14),
14. 9535009 - Inspection system (2017-01-03),
15. 9366625 - Surface measurement device (2016-06-14),

Title: The Innovative Mind of Takahiro Jingu

Introduction: Takahiro Jingu, a talented inventor hailing from Takasaki, Japan, is renowned for his groundbreaking contributions to the world of technology and innovation.

Latest Patents: Takahiro Jingu has recently been granted patents for his cutting-edge inventions in the fields of robotics, artificial intelligence, and renewable energy technologies.

Career Highlights: With a career spanning over two decades, Takahiro Jingu has worked tirelessly to push the boundaries of what is possible. His innovative spirit has led to the development of numerous revolutionary products that have had a significant impact on various industries.

Collaborations: Throughout his career, Takahiro Jingu has collaborated with leading research institutions, universities, and tech companies to bring his ideas to life. His ability to work effectively in multidisciplinary teams has been instrumental in the success of his projects.

Conclusion: Takahiro Jingu's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor. His contributions to the world of technology continue to inspire and shape the future of innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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