Average Co-Inventor Count = 7.2

ph-index = 16

Forward Citations = 564(Granted Patents)

Location History:

Kodaira, JP (1987 - 1988)
Ohume, JP (2011)
Ome, JP (1999 - 2013)
Oume, JP (2001 - 2017)

Company Filing History:

Hitachi-high-technologies Corporation

patents

3 out of 14

Hitachi High-tech Electronics Engineering Co., Ltd.

patents

4. 2 out of 88

Hitachi Electronics Engineering Co., Ltd.

patents

5. 2 out of 21

Hitachi Tokyo Electronics Co., Ltd.

patents

6. 1 out of 1

Hitachi Tokyo Electronics

patent

7. 1 out of 1

Hitachi Tokyo Engineering Co., Ltd.

patent

8. 1 out of 1

Hitachi High-technologies Corporaation

patent

9. 5 out of 832,680

Other

patents

where one patent can have more than one assignee

Years Active: 1987-2017

where 'Filed Patents' based on already Granted Patents

41 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 9551670 - Surface inspection apparatus and method thereof (2017-01-24),

2. 8729514 - Surface inspection apparatus and method thereof (2014-05-20),

3. 8559000 - Method of inspecting a semiconductor device and an apparatus thereof (2013-10-15),

4. 8558173 - Method of inspecting pattern and inspecting instrument (2013-10-15),

5. 8274651 - Method of inspecting a semiconductor device and an apparatus thereof (2012-09-25),

6. 8072597 - Method and its apparatus for inspecting particles or defects of a semiconductor device (2011-12-06),

7. 8040503 - Method of inspecting a semiconductor device and an apparatus thereof (2011-10-18),

8. 7952085 - Surface inspection apparatus and method thereof (2011-05-31),

9. 7643138 - Method of inspecting a semiconductor device and an apparatus thereof (2010-01-05),

10. 7483560 - Method for measuring three dimensional shape of a fine pattern (2009-01-27),

11. 7476856 - Sample dimension-measuring method and charged particle beam apparatus (2009-01-13),

12. 7417723 - Method of inspecting a semiconductor device and an apparatus thereof (2008-08-26),

13. 7417244 - Surface inspection apparatus and method thereof (2008-08-26),

14. 7411207 - Method and its apparatus for inspecting particles or defects of a semiconductor device (2008-08-12),

15. 7352890 - Method for analyzing circuit pattern defects and a system thereof (2008-04-01),

Title: Kenji Watanabe: Pioneering the Future of Inspection Technology

Introduction: Kenji Watanabe, a visionary inventor hailing from Oume, Japan, has made significant contributions to the field of inventions through his unwavering commitment to innovation and excellence. With 41 patents under his belt, Watanabe's trailblazing spirit continues to inspire generations of inventors and researchers worldwide.

Latest Patents: Kenji Watanabe's innovative genius shines in his latest patents, particularly in the development of a cutting-edge Surface Inspection Apparatus. This apparatus revolutionizes defect inspection processes through advanced illumination optical systems, detection optical systems, and signal processing systems, showcasing Watanabe's mastery in combining technology and functionality for enhanced performance.

Career Highlights: Throughout his career, Kenji Watanabe has left an indelible mark on the industry, having worked with prestigious companies such as Hitachi Co., Ltd and Hitachi High-Technologies Corporation. His expertise and dedication have led to the successful implementation of groundbreaking technologies that have redefined the standards of quality and precision in various sectors.

Collaborations: Collaboration plays a crucial role in Watanabe's journey towards innovation. Among his esteemed coworkers are Minori Noguchi and Hidetoshi Nishiyama, individuals who have shared his passion for pushing boundaries and achieving excellence in their respective fields. Together, they have fostered a culture of creativity and teamwork that has resulted in the development of groundbreaking inventions.

Conclusion: Kenji Watanabe's remarkable career trajectory exemplifies a fervent dedication to innovation and a relentless pursuit of technological advancement. His contributions to the field of inventions not only showcase his brilliance as an inventor but also serve as a source of inspiration for future generations to continue pushing the boundaries of what is possible in the realm of technology.

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