The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Sep. 13, 2011
Hidetoshi Nishiyama, Fujisawa, JP;
Minori Noguchi, Mitsukaido, JP;
Tetsuya Watanabe, Honjo, JP;
Takuaki Sekiguchi, Honjo, JP;
Hidetoshi Nishiyama, Fujisawa, JP;
Minori Noguchi, Mitsukaido, JP;
Tetsuya Watanabe, Honjo, JP;
Takuaki Sekiguchi, Honjo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A system for monitoring foreign matter includes a manufacturing line having plural process processing apparatuses, a production management system which manages the processing of workpieces in the manufacturing line, plural optical heads which monitor foreign matter in relation to at least one of the workpieces, and which provide an output signal indicative thereof, and at least one image signal processing unit provided in a lesser number than a number of the plural optical heads for processing the output signal therefrom.