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Akishima, Japan

Jeol Ltd.

USPTO Granted Patents = 804

EPO Patents = 244

Trademarks = 17

Forward Citations = 3,846

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664 inventors (with patents filed for the assignee):

Hidetaka Sawada (19 out of 19 patents)

Katsushige Tsuno (18 out of 20 patents)

Yuji Kohno (17 out of 17 patents)

4. Michio Okamura (17 out of 31 patents)

5. Fumio Hosokawa (15 out of 15 patents)

6. Shinichi Kitamura (14 out of 21 patents)

7. Yuki Endo (14 out of 39 patents)

8. Takaya Satoh (13 out of 14 patents)

9. Toshikatsu Kaneyama (13 out of 13 patents)

10. Shigeyuki Morishita (12 out of 12 patents)

11. Tsutomu Negishi (12 out of 19 patents)

12. Morio Ishihara (12 out of 18 patents)

13. Ayumi Kubo (10 out of 10 patents)

14. Shigenori Tsuji (10 out of 10 patents)

15. Kenichi Hasegawa (10 out of 34 patents)

Core Competencies:

Electron Microscope

Charged Particle Beam Device

Mass Spectrometry

Sample Analyzing Apparatus

Specimen Machining Device

Scanning Electron Microscope

Automated Analyzer

Phase Analyzer

Sample Processing Holder

Nuclear Magnetic Resonance

Beam Adjustment Method

Particle Filtration

804 patents: Sort by Forward Citations

1. 12512243 - Superconducting coil device (2025-12-30),

2. 12500064 - Charged particle beam apparatus and control method for charged particle beam apparatus (2025-12-16),

3. 12500059 - Sample milling apparatus, shield plate, and sample milling method (2025-12-16),

4. 12498269 - Phase analyzer, sample analyzer, and analysis method (2025-12-16),

5. 12487298 - MAS apparatus (2025-12-02),

6. 12482629 - Specimen processing holder and specimen processing method (2025-11-25),

7. 12476095 - Sample analyzing apparatus and method (2025-11-18),

8. 12476071 - Specimen machining device and specimen machining method (2025-11-18),

9. 12474424 - Sample tube transport apparatus (2025-11-18),

10. 12469675 - Phase analyzer, sample analyzer, and analysis method (2025-11-11),

11. 12467888 - Phase analyzer, sample analyzer, and analysis method (2025-11-11),

12. 12451337 - Sample cartridge carrier apparatus and carrier base (2025-10-21),

13. 12436120 - Sample container and measuring method (2025-10-07),

14. 12431328 - Electron microscope and calibration method (2025-09-30),

15. 12431326 - Charged particle beam device and image acquisition method (2025-09-30),

JEOL Ltd. is a leading global manufacturer of scientific instruments, with a focus on electron microscopes, mass spectrometers, and other analytical instruments. Established in 1949, JEOL has been instrumental in advancing research and development in a wide range of fields including nanotechnology, life sciences, materials science, and more. With a commitment to innovation, quality, and customer satisfaction, JEOL continues to deliver cutting-edge solutions to scientific communities worldwide.

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Company Badge

USPTO Data Jan 1 1976 - Dec 30 2025

804 Patents

#1 in Akishima

#260 in Japan

#1,215 in the World

Akishima, Japan

Jeol Ltd.

Forward Citations = 3,846

664 inventors:

Hidetaka Sawada (19 out of 19 patents)

Katsushige Tsuno (18 out of 20 patents)

Yuji Kohno (17 out of 17 patents)

4. Michio Okamura (17 out of 31 patents)

5. Fumio Hosokawa (15 out of 15 patents)

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