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Akishima, Japan

Jeol Ltd.

USPTO Granted Patents = 807

EPO Patents = 246

Trademarks = 17

Forward Citations = 3,848

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665 inventors (with patents filed for the assignee):

Hidetaka Sawada (19 out of 19 patents)

Yuji Kohno (18 out of 18 patents)

Katsushige Tsuno (18 out of 20 patents)

4. Michio Okamura (17 out of 31 patents)

5. Fumio Hosokawa (15 out of 15 patents)

6. Shinichi Kitamura (14 out of 21 patents)

7. Yuki Endo (14 out of 39 patents)

8. Takaya Satoh (13 out of 14 patents)

9. Shigeyuki Morishita (13 out of 13 patents)

10. Toshikatsu Kaneyama (13 out of 13 patents)

11. Tsutomu Negishi (12 out of 19 patents)

12. Morio Ishihara (12 out of 18 patents)

13. Ayumi Kubo (10 out of 10 patents)

14. Shigenori Tsuji (10 out of 10 patents)

15. Kenichi Hasegawa (10 out of 34 patents)

Core Competencies:

Electron Microscope

Charged Particle Beam Device

Mass Spectrometry

Sample Analyzing Apparatus

Specimen Machining Device

Scanning Electron Microscope

Automated Analyzer

Phase Analyzer

Sample Processing Holder

Nuclear Magnetic Resonance

Beam Adjustment Method

Particle Filtration

807 patents: Sort by Forward Citations

1. D1109207 - Electron microscope (2026-01-13),

2. 12525431 - Aberration corrector and electron microscope (2026-01-13),

3. 12518944 - Electron microscope and image acquisition method (2026-01-06),

4. 12512243 - Superconducting coil device (2025-12-30),

5. 12500064 - Charged particle beam apparatus and control method for charged particle beam apparatus (2025-12-16),

6. 12500059 - Sample milling apparatus, shield plate, and sample milling method (2025-12-16),

7. 12498269 - Phase analyzer, sample analyzer, and analysis method (2025-12-16),

8. 12487298 - MAS apparatus (2025-12-02),

9. 12482629 - Specimen processing holder and specimen processing method (2025-11-25),

10. 12476095 - Sample analyzing apparatus and method (2025-11-18),

11. 12476071 - Specimen machining device and specimen machining method (2025-11-18),

12. 12474424 - Sample tube transport apparatus (2025-11-18),

13. 12469675 - Phase analyzer, sample analyzer, and analysis method (2025-11-11),

14. 12467888 - Phase analyzer, sample analyzer, and analysis method (2025-11-11),

15. 12451337 - Sample cartridge carrier apparatus and carrier base (2025-10-21),

JEOL Ltd. is a leading global manufacturer of scientific instruments, with a focus on electron microscopes, mass spectrometers, and other analytical instruments. Established in 1949, JEOL has been instrumental in advancing research and development in a wide range of fields including nanotechnology, life sciences, materials science, and more. With a commitment to innovation, quality, and customer satisfaction, JEOL continues to deliver cutting-edge solutions to scientific communities worldwide.

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Company Badge

USPTO Data Jan 1 1976 - Jan 13 2026

807 Patents

#1 in Akishima

#259 in Japan

#1,210 in the World

Akishima, Japan

Jeol Ltd.

Forward Citations = 3,848

665 inventors:

Hidetaka Sawada (19 out of 19 patents)

Yuji Kohno (18 out of 18 patents)

Katsushige Tsuno (18 out of 20 patents)

4. Michio Okamura (17 out of 31 patents)

5. Fumio Hosokawa (15 out of 15 patents)

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