The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2024
Filed:
Oct. 22, 2021
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Hitachi High-technologies Corporation, Tokyo, JP;
Kouhei Nonaka, Tokyo, JP;
Takamichi Mori, Tokyo, JP;
Yoichi Aruga, Tokyo, JP;
Yosuke Horie, Tokyo, JP;
Andrew McCaughey, Baar, CH;
Alexander Seiler, Habach, DE;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A method of washing an aspiration probe of an in-vitro diagnostic system is disclosed. The aspiration probe comprises an outer surface and an inner surface forming an inner space for receiving a fluid. The method comprises dipping the aspiration probe into a first wash fluid so that the outer surface is immersed at least in part into the first wash fluid, aspirating an amount of the first wash fluid into the inner space of the aspiration probe, propagating an ultrasonic vibration to the outer surface of the aspiration probe via the first wash fluid, and rinsing the outer surface and the inner surface of the aspiration probe with a second wash fluid. Further, an in-vitro diagnostic method and an in-vitro diagnostic system are disclosed.