Takehiro Hirai

This inventor holds 66 USPTO granted patents and 3 published patent applications, plus 1 CIPO patent, primarily in Defect Observation Technology (CPC class G06T). Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation, Sankyo Company, Limited. Active years: 2005-2026.

USPTO Granted Patents = 66 (Patent Applications = 3)

% Patents Active = 83.3

CIPO Patents = 1

Average Co-Inventor Count = 3.3

ph-index = 7

Forward Citations = 154(Granted Patents)

Forward Citations (Not Self Cited) = 140(Dec 10, 2025)

Inventors with similar research interests:

Location History:

Hitachinaka, JP (2005)
Ushiku, JP (2008 - 2016)
Tokyo, JP (2008 - 2023)

Company Filing History:

51 out of 2,874

Hitachi-High-Technologies Corporation

patents

9 out of 1,363

Hitachi High-Tech Corporation

patents

3 out of 613

Sankyo Company, Limited

patents

4. 2 out of 460

Daiichi Sankyo Company, Limited

The University of Tokyo

patents

where one patent can have more than one assignee

Years Active: 2005-2026

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Areas of Expertise:

Defect Classification

Wafer Observation

Anti-GPR20 Antibody

Defect Inspection

Charged-Particle Beam

Sample Observation

Defect Quantification

Image Classification

Defect Analysis

Semiconductor Technology

Defect Evaluation

Surface Observation

66 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12682442 - Inspection system for detecting foreign material and scratch at edge of semiconductor wafer and non-transitory computer-readable medium storing a program for same (2026-07-14),

2. 12511729 - Defect classification device and defect classification program (2025-12-30),

3. 11670528 - Wafer observation apparatus and wafer observation method (2023-06-06),

4. 11434289 - Anti-GPR20 antibody and anti-GPR20 antibody-drug conjugate (2022-09-06),

5. 11177111 - Defect observation device (2021-11-16),

6. 11170483 - Sample observation device and sample observation method (2021-11-09),

7. 11087454 - Defect observation device and defect observation method (2021-08-10),

8. 10977786 - Wafer observation device (2021-04-13),

9. 10971325 - Defect observation system and defect observation method for semiconductor wafer (2021-04-06),

10. 10906974 - Anti-GPR20 antibody and anti-GPR20 antibody-drug conjugate (2021-02-02),

11. 10810733 - Defect classification apparatus and defect classification method (2020-10-20),

12. 10770260 - Defect observation device (2020-09-08),

13. 10559074 - Sample observation device and sample observation method (2020-02-11),

14. 10297021 - Defect quantification method, defect quantification device, and defect evaluation value display device (2019-05-21),

15. 10229812 - Sample observation method and sample observation device (2019-03-12),

Title: The Innovative Mind of Takehiro Hirai

Introduction: Takehiro Hirai is a visionary inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Takehiro Hirai holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach to problem-solving.

Career Highlights: With a career spanning over two decades, Takehiro Hirai has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various industries.

Collaborations: Throughout his career, Takehiro Hirai has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge-sharing.

Conclusion: Takehiro Hirai's passion for innovation and his relentless drive to push the boundaries of technology make him a true pioneer in the world of inventions. His work continues to inspire the next generation of inventors and shape the future of technological advancements.