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For the Inventor, By the Inventor

Pleasanton, CA, United States of America

Shifang Li

USPTO Granted Patents = 71 

 

Average Co-Inventor Count = 2.2

ph-index = 10

Forward Citations = 369(Granted Patents)

Forward Citations (Not Self Cited) = 283(Dec 10, 2025)


Inventors with similar research interests:


Company Filing History:

goldMedal31 out of 10,326 
 
Tokyo Electron Limited
 patents
silverMedal13 out of 1,787 
 
Kla Tencor Corporation
 patents
bronzeMedal12 out of 72 
 
Timbre Technologies, Inc.
 patents
4. 5 out of 115 
 
Oplink Communications, Inc.
 patents
5. 3 out of 530 
 
Kla Corporation
 patents
6. 3 out of 13,713 
 
Applied Materials, Inc.
 patents
7. 1 out of 1 
 
Transamerica Technologies International
 patent
8. 1 out of 1 
 
Transamerican Technologies International Dba Tti Medical
 patent
9. 1 out of 1 
 
Oplinic Communications, Inc.
 patent
10. 1 out of 153 
 
Nanometrics Inc.
 patents

Years Active: 2000-2025

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Areas of Expertise:
Optical Metrology
Semiconductor Inspection
Spectroscopic Measurements
Height Sensor Technology
Inline Screening
Process Control
Diffraction Models
Wafer Level Packaging
Automated Inspection
Sensor Data Analysis
Metrology Calibration
Photonic Nanojet
71 patents (USPTO):Explore Patents
1. 12489005 - Temperature-based metrology calibration at a manufacturing system (2025-12-02),
2. 12422376 - Imaging reflectometry for inline screening (2025-09-23),
3. 12386342 - Holistic analysis of multidimensional sensor data for substrate processing equipment (2025-08-12),
4. 12249525 - Using spectroscopic measurements for substrate temperature monitoring (2025-03-11),
5. 11544838 - Systems and methods of high-resolution review for semiconductor inspection in backend and wafer level packaging (2023-01-03),
6. 11221300 - Determining metrology-like information for a specimen using an inspection tool (2022-01-11),
7. 10563973 - All surface film metrology system (2020-02-18),
8. 10540759 - Bonded wafer metrology (2020-01-21),
9. 10495446 - Methods and apparatus for measuring height on a semiconductor wafer (2019-12-03),
10. 10372113 - Method for defocus detection (2019-08-06),
11. 10088298 - Method of improving lateral resolution for height sensor using differential detection technology for semiconductor inspection and metrology (2018-10-02),
12. 9958257 - Increasing dynamic range of a height sensor for inspection and metrology (2018-05-01),
13. 9885656 - Line scan knife edge height sensor for semiconductor inspection and metrology (2018-02-06),
14. 9863756 - Line scan spectroscopic white light interferometry for semiconductor inspection and metrology (2018-01-09),
15. 9747520 - Systems and methods for enhancing inspection sensitivity of an inspection tool (2017-08-29),

Title: The Innovative Journey of Inventor Shifang Li

Introduction: Shifang Li, a talented inventor based in Pleasanton, CA, has made significant contributions to the world of technology through his groundbreaking innovations.

Latest Patents: Shifang Li holds several patents in the field of artificial intelligence and renewable energy technologies, showcasing his commitment to creating sustainable solutions for the future.

Career Highlights: With a background in engineering and a passion for problem-solving, Shifang Li has led successful projects that have revolutionized the way we approach clean energy and data analysis.

Collaborations: Throughout his career, Shifang Li has collaborated with leading research institutions and tech companies to further develop his inventions and bring them to market, solidifying his reputation as a visionary in his field.

Conclusion: Inventor Shifang Li's dedication to innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the landscape of technological advancements.

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