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For the Inventor, By the Inventor

Milpitas, CA, United States of America

Kla Corporation


USPTO Granted Patents = 533


Trademarks = 77

Forward Citations = 392

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812 inventors (with patents filed for the assignee):

goldMedal Amnon Manassen (49 out of 112 patents)

silverMedal Vladimir Levinski (30 out of 96 patents)

bronzeMedal Andrew V Hill (29 out of 71 patents)

4.  John Fielden (26 out of 139 patents)

5.  Yung-Ho Alex Chuang (26 out of 159 patents)

6.  Bjorn Brauer (19 out of 45 patents)

7.  Andrei V Shchegrov (18 out of 97 patents)

8.  Ilya Bezel (18 out of 69 patents)

9.  Mark Ghinovker (18 out of 81 patents)

10.  Daria Negri (17 out of 29 patents)

11.  Stilian Pandev (16 out of 63 patents)

12.  Yinying Xiao-Li (16 out of 20 patents)

13.  Roie Volkovich (16 out of 35 patents)

14.  Sangbong Park (15 out of 24 patents)

15.  Yoel Feler (14 out of 35 patents)


Core Competencies:
Overlay Metrology
Three-Dimensional Imaging
Deep Learning
Semiconductor Measurements
Optical Metrology
Image Alignment
Defect Detection
X-Ray Scatterometry
Machine Learning Optimization
Electromagnetic Coil Cooling
High-Power Laser Systems
Nanosheet Surface Profiling

533 patents:

1. 12510831 - Robust and accurate overlay target design for CMP (2025-12-30),
2. 12510692 - Protection of optical materials of optical components from radiation degradation (2025-12-30),
3. 12510590 - Metrology in the presence of CMOS under array (CuA) structures utilizing an effective medium model with physical modeling (2025-12-30),
4. 12504697 - Single grab pupil landscape via broadband illumination (2025-12-23),
5. 12494339 - High resolution, multi-electron beam apparatus (2025-12-09),
6. 12487533 - Amplitude asymmetry measurements in overlay metrology (2025-12-02),
7. 12487190 - System and method for isolation of specific fourier pupil frequency in overlay metrology (2025-12-02),
8. 12487175 - Three-dimensional imaging with enhanced resolution (2025-12-02),
9. 12484316 - CVD boron uniformity overcoming loading effects (2025-11-25),
10. 12482687 - Single cell in-die metrology targets and measurement methods (2025-11-25),
11. 12482091 - Detecting defects on specimens (2025-11-25),
12. 12480893 - Optical and X-ray metrology methods for patterned semiconductor structures with randomness (2025-11-25),
13. 12480890 - Deep learning based mode selection for inspection (2025-11-25),
14. 12474557 - Automated focusing system for tracking specimen surface with a configurable focus offset (2025-11-18),
15. 12474281 - Semiconductor measurements with robust in-line tool matching (2025-11-18),
KLA Corporation is a leading provider of process control and yield management solutions for the semiconductor and related nanoelectronics industries. The company's innovations enable devices to be built at increasingly higher levels of performance and at lower costs. KLA Corporation's products and services are used by chip manufacturers worldwide to improve their manufacturing processes and yields. With headquarters in Milpitas, California, KLA Corporation operates globally with offices, manufacturing sites, and R&D centers located in key semiconductor manufacturing regions.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 30 2025

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533 Patents

#11 in Milpitas, CA

#206 in California

#887 in US

#1,775 in the World

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Milpitas, CA, United States of America

Kla Corporation

Forward Citations = 392

812 inventors:

goldMedal Amnon Manassen (49 out of 112 patents)

silverMedal Vladimir Levinski (30 out of 96 patents)

bronzeMedal Andrew V Hill (29 out of 71 patents)

4.  John Fielden (26 out of 139 patents)

5.  Yung-Ho Alex Chuang (26 out of 159 patents)

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