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For the Inventor, By the Inventor

Milpitas, CA, United States of America

Kla Corporation


USPTO Granted Patents = 529


Trademarks = 102

Forward Citations = 371

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816 inventors (with patents filed for the assignee):

goldMedal Amnon Manassen (49 out of 112 patents)

silverMedal Andrew V Hill (29 out of 71 patents)

bronzeMedal Vladimir Levinski (28 out of 94 patents)

4.  John Fielden (26 out of 139 patents)

5.  Yung-Ho Alex Chuang (26 out of 159 patents)

6.  Bjorn Brauer (19 out of 45 patents)

7.  Andrei V Shchegrov (18 out of 97 patents)

8.  Ilya Bezel (18 out of 69 patents)

9.  Daria Negri (17 out of 29 patents)

10.  Mark Ghinovker (17 out of 80 patents)

11.  Stilian Pandev (16 out of 63 patents)

12.  Yinying Xiao-Li (16 out of 20 patents)

13.  Roie Volkovich (16 out of 35 patents)

14.  Sangbong Park (15 out of 24 patents)

15.  Yoel Feler (13 out of 34 patents)


Core Competencies:
Overlay Metrology
Three-Dimensional Imaging
Deep Learning
Semiconductor Measurements
Optical Metrology
Image Alignment
Defect Detection
X-Ray Scatterometry
Machine Learning Optimization
Electromagnetic Coil Cooling
High-Power Laser Systems
Nanosheet Surface Profiling

529 patents:

1. 12494339 - High resolution, multi-electron beam apparatus (2025-12-09),
2. 12487533 - Amplitude asymmetry measurements in overlay metrology (2025-12-02),
3. 12487190 - System and method for isolation of specific fourier pupil frequency in overlay metrology (2025-12-02),
4. 12487175 - Three-dimensional imaging with enhanced resolution (2025-12-02),
5. 12484316 - CVD boron uniformity overcoming loading effects (2025-11-25),
6. 12482687 - Single cell in-die metrology targets and measurement methods (2025-11-25),
7. 12482091 - Detecting defects on specimens (2025-11-25),
8. 12481223 - System and method for optimizing through silicon via overlay (2025-11-25),
9. 12480893 - Optical and X-ray metrology methods for patterned semiconductor structures with randomness (2025-11-25),
10. 12480890 - Deep learning based mode selection for inspection (2025-11-25),
11. 12474557 - Automated focusing system for tracking specimen surface with a configurable focus offset (2025-11-18),
12. 12474281 - Semiconductor measurements with robust in-line tool matching (2025-11-18),
13. 12462968 - Systems and methods for uniform cooling of electromagnetic coil (2025-11-04),
14. 12461041 - Measurement of thick films and high aspect ratio structures (2025-11-04),
15. 12452987 - High-power compact VUV laser-sustained plasma light source (2025-10-21),
KLA Corporation is a leading provider of process control and yield management solutions for the semiconductor and related nanoelectronics industries. The company's innovations enable devices to be built at increasingly higher levels of performance and at lower costs. KLA Corporation's products and services are used by chip manufacturers worldwide to improve their manufacturing processes and yields. With headquarters in Milpitas, California, KLA Corporation operates globally with offices, manufacturing sites, and R&D centers located in key semiconductor manufacturing regions.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 9 2025

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529 Patents

#11 in Milpitas, CA

#208 in California

#896 in US

#1,787 in the World

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Milpitas, CA, United States of America

Kla Corporation

Forward Citations = 371

816 inventors:

goldMedal Amnon Manassen (49 out of 112 patents)

silverMedal Andrew V Hill (29 out of 71 patents)

bronzeMedal Vladimir Levinski (28 out of 94 patents)

4.  John Fielden (26 out of 139 patents)

5.  Yung-Ho Alex Chuang (26 out of 159 patents)

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