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For the Inventor, By the Inventor

Haifa, Israel

Yoel Feler

USPTO Granted Patents = 34 

 

Average Co-Inventor Count = 3.8

ph-index = 6

Forward Citations = 149(Granted Patents)


Company Filing History:

goldMedal18 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal13 out of 530 
 
Kla Corporation
 patents
where one patent can have more than one assignee

Years Active: 2016-2025

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34 patents (USPTO):Explore Patents
1. 12347706 - Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful therein (2025-07-01),
2. 12204254 - Multi-layered moiré targets and methods for using the same in measuring misregistration of semiconductor devices (2025-01-21),
3. 12105433 - Imaging overlay targets using moiré elements and rotational symmetry arrangements (2024-10-01),
4. 12094100 - Measurement of stitching error using split targets (2024-09-17),
5. 12055859 - Overlay mark design for electron beam overlay (2024-08-06),
6. 12013634 - Reduction or elimination of pattern placement error in metrology measurements (2024-06-18),
7. 11862524 - Overlay mark design for electron beam overlay (2024-01-02),
8. 11862522 - Accuracy improvements in optical metrology (2024-01-02),
9. 11774863 - Induced displacements for improved overlay error metrology (2023-10-03),
10. 11720031 - Overlay design for electron beam and scatterometry overlay measurements (2023-08-08),
11. 11686576 - Metrology target for one-dimensional measurement of periodic misregistration (2023-06-27),
12. 11614692 - Self-Moire grating design for use in metrology (2023-03-28),
13. 11604149 - Metrology methods and optical schemes for measurement of misregistration by using hatched target designs (2023-03-14),
14. 11537043 - Reduction or elimination of pattern placement error in metrology measurements (2022-12-27),
15. 11302544 - Method for measuring and correcting misregistration between layers in a semiconductor device, and misregistration targets useful therein (2022-04-12),

Title: Yoel Feler: Pioneering Inventor from Haifa, IL

Introduction: Yoel Feler is a distinguished inventor hailing from Haifa, Israel, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Yoel Feler holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his versatility and ingenuity in various sectors.

Career Highlights: With a career spanning over two decades, Feler has worked with leading research institutions and tech companies, consistently pushing the boundaries of what is possible through his inventive spirit.

Collaborations: Throughout his career, Yoel Feler has collaborated with top engineers, scientists, and designers, fostering a culture of innovation and excellence in all his projects.

Conclusion: Yoel Feler's passion for innovation and his relentless drive to create solutions for complex challenges make him a true pioneer in the world of inventions.

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