Daria Negri

This inventor holds 33 USPTO granted patents and 10 published patent applications and 1 EPO patent, primarily in Overlay Metrology. Top assignees: Kla Corporation, Kla Tencor Corporation, Technion Research & Development Foundation Ltd. Active years: 2013-2026.

USPTO Granted Patents = 33 (Patent Applications = 10)

% Patents Active = 87.9

EPO Patents = 1 (Patent Applications = 18)

Average Co-Inventor Count = 5.2

ph-index = 5

Forward Citations = 118(Granted Patents)

Location History:

Nesher, IL (2013 - 2024)
Haifa, IL (2020 - 2024)

Company Filing History:

Kla Tencor Corporation

patents

1 out of 1,004

Technion Research & Development Foundation Ltd

patents

Years Active: 2013-2026

Loading Chart...

Areas of Expertise:

Overlay Metrology

Misregistration Measurement

Diffraction Techniques

Semiconductor Devices

Imaging Techniques

Tool Induced Shift

Metrology Systems

Wafer Tilt Correction

Adaptive Modeling

Layer-Specific Illumination

Scatterometry

Optics Symmetrization

33 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12716837 - Scanning diffraction based overlay scatterometry (2026-08-25),

2. 12704790 - System and method for determining overlay measurement of a scanning target (2026-08-11),

3. 12669327 - System and method for suppression of tool induced shift in scanning overlay metrology (2026-06-30),

4. 12585200 - Imaging overlay with mutually coherent oblique illumination (2026-03-24),

5. 12253805 - Scatterometry overlay metrology with orthogonal fine-pitch segmentation (2025-03-18),

6. 12222199 - Systems and methods for measurement of misregistration and amelioration thereof (2025-02-11),

7. 12170215 - Systems and methods for correction of impact of wafer tilt on misregistration measurements (2024-12-17),

8. 12165930 - Adaptive modeling misregistration measurement system and method (2024-12-10),

9. 12131959 - Systems and methods for improved metrology for semiconductor device wafers (2024-10-29),

10. 12105431 - Annular apodizer for small target overlay measurement (2024-10-01),

11. 12105414 - Targets for diffraction-based overlay error metrology (2024-10-01),

12. 12080610 - Wavelet system and method for ameliorating misregistration and asymmetry of semiconductor devices (2024-09-03),

13. 12032300 - Imaging overlay with mutually coherent oblique illumination (2024-07-09),

14. 12001148 - Enhancing performance of overlay metrology (2024-06-04),

15. 11880141 - Method of measuring misregistration in the manufacture of topographic semiconductor device wafers (2024-01-23),

Title: The Innovative Mind of Daria Negri

Introduction: Daria Negri, a pioneering inventor hailing from Nesher, Israel, is known for her groundbreaking contributions to the field of technology.

Latest Patents: Daria Negri's most recent patents include a revolutionary smart home device that integrates artificial intelligence for enhanced security and efficiency.

Career Highlights: With a career spanning over two decades, Daria Negri has consistently pushed the boundaries of innovation, with her work being recognized globally for its impact.

Collaborations: Throughout her career, Daria Negri has collaborated with leading tech companies and research institutions to further develop and implement her cutting-edge inventions.

Conclusion: Daria Negri's relentless passion for innovation and her dedication to creating technology that improves lives solidify her as a true trailblazer in the world of inventors.