Campbell, CA, United States of America

Andrei V Shchegrov

USPTO Granted Patents = 97 

 

Average Co-Inventor Count = 3.9

ph-index = 17

Forward Citations = 1,027(Granted Patents)

Forward Citations (Not Self Cited) = 918(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Cambell, CA (US) (2022)
  • Campbell, CA (US) (2005 - 2024)
  • Los Gatos, CA (US) (2016 - 2024)

Company Filing History:


Years Active: 2005-2025

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Areas of Expertise:
Overlay Metrology
Semiconductor Measurement
X-Ray Scatterometry
Optical Metrology
Spectroscopic Metrology
Edge Placement Error
Hyperspectral Imaging
Reflectometry
Process Control
Device Inspection
Patterned Wafer Characterization
Calibration Techniques
97 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Andrei V Shchegrov

Introduction

Andrei V Shchegrov, based in Campbell, California, is an accomplished inventor with an impressive portfolio of 96 patents. His work primarily focuses on advancements in semiconductor measurement technology, and he has significantly contributed to the field through his innovative solutions.

Latest Patents

Among Andrei's latest patents is a groundbreaking device feature specific edge placement error (EPE). This system and method offers a novel approach to generating metrology measurements using a second sub-system, such as an optical sub-system. The process involves performing a training operation that includes receiving initial metrology data from the first metrology sub-system, generating first metrology measurements, and binning device features based on these measurements. The method subsequently allows for a run-time operation that provides continuous updates on metrology measurements, enhancing the reliability of semiconductor manufacturing processes.

Another significant patent focuses on methods and systems for targeted monitoring of semiconductor measurement quality. This innovation shifts the paradigm from using general indices to implement specific measurement quality indicators, thereby offering deeper insights into operational issues that may impact measurement accuracy. By extracting features from measurement data, these targeted indicators help identify deficiencies and contribute to improved semiconductor measurement quality.

Career Highlights

Throughout his career, Andrei has had the opportunity to work at notable companies such as KLA-Tencor Corporation and KLA Corporation, where he honed his skills in semiconductor technology and measurement systems. His experience in these influential organizations has undoubtedly shaped his innovative contributions to the field.

Collaborations

Andrei has collaborated with talented professionals like Stilian Pandev and Alexander Kuznetsov. These partnerships have fostered a creative environment that encourages groundbreaking ideas and innovative solutions in semiconductor technology.

Conclusion

Andrei V Shchegrov's extensive patent portfolio and his pioneering work in semiconductor measurement reflect his dedication to innovation. His contributions have not only advanced industry standards but also paved the way for future developments in the field of semiconductor technology.

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