For the Inventor, By the Inventor

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Washington, DC, United States of America

Timbre Technologies, Inc.

USPTO Granted Patents = 72

Forward Citations = 1,728

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39 inventors (with patents filed for the assignee):

Xinhui Niu (37 out of 42 patents)

Nickhil Jakatdar (36 out of 46 patents)

Junwei Bao (30 out of 126 patents)

4. Vi Vuong (15 out of 40 patents)

5. Joerg Bischoff (13 out of 24 patents)

6. Shifang Li (12 out of 71 patents)

7. Srinivas Rao Doddi (12 out of 25 patents)

8. Emmanuel Drege (9 out of 18 patents)

9. Lawrence Lane (6 out of 7 patents)

10. Manuel B Madriaga (4 out of 30 patents)

11. Michael Laughery (3 out of 3 patents)

12. Sanjay K Yedur (3 out of 44 patents)

13. Saeed Assadi (2 out of 2 patents)

14. James Pogge (2 out of 2 patents)

15. Jason Ferns (2 out of 9 patents)

Core Competencies:

Radiation Detection

Field Effect Transistor

Optical Metrology

Machine Learning Systems

Semiconductor Wafer

Diffraction Signals

Parameter Selection

Model Optimization

Grating Diffraction

Data Compression

Process Control

Integrated Circuit

72 patents: Sort by Forward Citations

1. 11835391 - Radiation detector including field effect transistor in resonant cavity nanostructure (2023-12-05),

2. 11209318 - Radiation detector including field effect transistor in resonant cavity nanostructure (2021-12-28),

3. 7515282 - Modeling and measuring structures with spatially varying properties in optical metrology (2009-04-07),

4. 7505153 - Model and parameter selection for optical metrology (2009-03-17),

5. 7474993 - Selection of wavelengths for integrated circuit optical metrology (2009-01-06),

6. 7474420 - In-die optical metrology (2009-01-06),

7. 7467064 - Transforming metrology data from a semiconductor treatment system using multivariate analysis (2008-12-16),

8. 7453584 - Examining a structure formed on a semiconductor wafer using machine learning systems (2008-11-18),

9. 7450232 - Generic interface for an optical metrology system (2008-11-11),

10. 7444196 - Optimized characterization of wafers structures for optical metrology (2008-10-28),

11. 7440881 - Adaptive correlation of pattern resist structures using optical metrology (2008-10-21),

12. 7428060 - Optimization of diffraction order selection for two-dimensional structures (2008-09-23),

13. 7427521 - Generating simulated diffraction signals for two-dimensional structures (2008-09-23),

14. 7421414 - Split machine learning systems (2008-09-02),

15. 7414733 - Azimuthal scanning of a structure formed on a semiconductor wafer (2008-08-19),

Timbre Technologies, Inc. is a technology company specializing in AI-driven audio analysis solutions. With our cutting-edge software and expert algorithms, we enable businesses in various industries to extract valuable insights from audio data. Our innovative solutions cater to sectors including call centers, voice assistants, music platforms, and more. Through our advanced audio processing technologies, we help companies enhance customer experiences, improve operational efficiency, and drive data-driven decision-making. Visit our website for more information and to explore our range of AI audio analysis solutions.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

72 Patents

#21 in Washington, DC

#21 in District of Columbia

#4,874 in US

#9,936 in the World

Washington, DC, United States of America

Timbre Technologies, Inc.

Forward Citations = 1,728

39 inventors:

Xinhui Niu (37 out of 42 patents)

Nickhil Jakatdar (36 out of 46 patents)

Junwei Bao (30 out of 126 patents)

4. Vi Vuong (15 out of 40 patents)

5. Joerg Bischoff (13 out of 24 patents)

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