Location History:
- Iimenau, DE (2009)
- Illmenau, DE (2005 - 2011)
- Ilmenau, DE (2004 - 2017)
Company Filing History:
13 out of 72 
10 out of 10,295 
3 out of 1,787 
Years Active: 2004-2017
Title: Innovations and Contributions of Joerg Bischoff in Optical Metrology
Introduction
Joerg Bischoff is an accomplished inventor based in Illmenau, Germany, holding a remarkable portfolio of 24 patents. His work has significantly advanced the field of optical metrology, focusing on enhancing computation efficiency and precision in measuring diffraction signals.
Latest Patents
Among his latest patents, Joerg's work on *Computation Efficiency by Diffraction Order Truncation* presents an innovative method aimed at improving computation efficiency for diffraction signals. The method systematically simulates a set of diffraction orders pertaining to a three-dimensional structure. By prioritizing these diffraction orders, the set is consequently truncated to generate a streamlined spectrum for analysis.
Another noteworthy patent tackles *Numerical Aperture Integration for Optical Critical Dimension (OCD) Metrology*. This invention provides sophisticated techniques for numerically integrating intensity distribution functions across different numerical apertures. The approach considers the presence of Rayleigh singularities and utilizes Gaussian quadrature for more accurate results, factoring in the effects of the Wood anomaly while performing the integration.
Career Highlights
Throughout his career, Joerg Bischoff has contributed to major companies in the field, including Timbre Technologies, Inc. and Tokyo Electron Limited. His experience in these organizations has allowed him to push the boundaries of innovation in optical metrology.
Collaborations
Collaborating with esteemed colleagues, such as Xinhui Niu and Junwei Bao, Joerg has leveraged team efforts to drive advancements in technology. Their combined expertise has led to significant developments in the methodologies used for optical measurements.
Conclusion
Joerg Bischoff's contributions through his patents underline his innovative spirit and dedication to advancing optical metrology. His cutting-edge work continues to shape the industry, paving the way for future inventors and researchers in the field.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.