The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Aug. 04, 2017
Applicant:

Kla-tencor Corporation, Milpitas, CA (US);

Inventors:

Xuguang Jiang, Sunnyvale, CA (US);

Shifang Li, Pleasanton, CA (US);

Yong Zhang, Cupertino, CA (US);

Assignee:

KLA-Tencor Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G05B 19/418 (2006.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/174 (2017.01);
U.S. Cl.
CPC ...
G05B 19/418 (2013.01); G06T 7/0004 (2013.01); G06T 7/11 (2017.01); G06T 7/174 (2017.01); G05B 2219/45027 (2013.01); G05B 2219/45031 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10148 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30148 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Two or more color data can be combined to form a new data source to enhance sensitivity to defocus signal. Defocus detection can be performed on the newly formed data source. In a setup step, a training wafer can be used to select the best color combination, and obtain defocus detection threshold. This can include applying a segment mask, calculating mean intensities of the segment, determining a color combination that optimizes defocus sensitivity, and generating a second segment mask based on pixels that are above a threshold to sensitivity. In a detection step, the selected color combination is calculated, and the threshold is applied to obtain defocus detection result.


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