Company Filing History:
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Years Active: 2011-2023
Title: Yong Zhang: Innovator in Advanced Inspection Systems
Introduction
Yong Zhang, based in Cupertino, CA, has made significant contributions to the field of inspection technology with a total of 19 patents to his name. His work focuses on enhancing the detection of defects on specimens, particularly in environments with low signal-to-noise ratios.
Latest Patents
Zhang's most recent patents showcase advanced techniques in digital image processing for defect detection. One notable innovation is the "Frequency domain enhancement of low-SNR flat residue/stain defects for effective detection." This inspection system comprises a controller that connects to an inspection sub-system. The process involves receiving illumination from a sample, generating image data, and employing methods like bicubic and bilinear interpolation for downsampling images. Using Fourier transforms, Zhang's system filters high-frequency noise, allowing for accurate defect detection in flat-pattern images.
Another important patent is related to the "Inspection of noisy patterned features." This system is designed to efficiently identify defects in specimens by analyzing images generated by the inspection subsystem. The detection process involves recognizing patterned features and calculating differences in pixel characteristics to identify defect candidates effectively.
Career Highlights
Yong Zhang has had a distinguished career, highlighted by his work with notable companies such as KLA-Tencor Corporation and KLA Corporation. His focus in these roles has been on utilizing innovative technologies to improve the quality and reliability of inspections in various industrial applications.
Collaborations
Throughout his career, Zhang has collaborated with esteemed colleagues, including Tao Luo and Stephanie Chen. These collaborations have further enriched his research and have contributed to the development of cutting-edge inspection systems.
Conclusion
Yong Zhang's contributions to the field of inspection technology through his 19 patents reflect his commitment to innovation and excellence. His recent work in enhancing defect detection techniques positions him as a key figure in advancing the capabilities of inspection systems, paving the way for improvements in various industries.