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San Jose, CA, United States of America

Unity Semiconductor Corporation

USPTO Granted Patents = 299

EPO Patents = 25

Forward Citations = 4,941

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73 inventors (with patents filed for the assignee):

Christophe J Chevallier (119 out of 311 patents)

Darrell Rinerson (93 out of 100 patents)

Robert D Norman (90 out of 229 patents)

4. Chang Hua Siau (68 out of 106 patents)

5. Wayne I Kinney (51 out of 116 patents)

6. Steven W Longcor (48 out of 58 patents)

7. Edmond R Ward (36 out of 49 patents)

8. Steve Kuo-Ren Hsia (33 out of 36 patents)

9. Bruce Lynn Bateman (23 out of 65 patents)

10. Lawrence Schloss (23 out of 38 patents)

11. Rene Meyer (18 out of 23 patents)

12. Seow Fong Lim (15 out of 29 patents)

13. Julie Casperson Brewer (15 out of 15 patents)

14. John Espinoza Sanchez, Jr (12 out of 24 patents)

15. Roy Lambertson (11 out of 15 patents)

Core Competencies:

Optical Inspection

Crystalline Defects

Substrate Characterization

Vertical Cross-Point Arrays

Memory Access Signals

Conductive Metal Oxide Structures

Interferometric Inspection

Dimensional Measurements

High Voltage Switching

Laser Doppler Effect

Resistive Memory Elements

Integrated Circuit Inspection

299 patents: Sort by Forward Citations

1. 12444039 - Method and a system for characterising structures through a substrate (2025-10-14),

2. 12196681 - Method and a device for detecting crystalline defects in a substrate by dark field and photoluminescence (2025-01-14),

3. 12163899 - System for optical inspection of a substrate using same or different wavelengths (2024-12-10),

4. 12123698 - Method and a system for characterizing structures through a substrate (2024-10-22),

5. 12079979 - Method and a system for characterising structures through a substrate (2024-09-03),

6. 12074400 - Substrate dimension adapter (2024-08-27),

7. 11965834 - Dark-field optical inspection device (2024-04-23),

8. 11965730 - Method for measuring film thickness distribution of wafer with thin films (2024-04-23),

9. 11959737 - Method and a system for combined characterisation of structures etched in a substrate (2024-04-16),

10. 11959736 - Method and a system for characterising structures etched in a substrate (2024-04-16),

11. 11942379 - Inspection method for detecting a defective bonding interface in a sample substrate, and measurement system implementing the method (2024-03-26),

12. 11906302 - Method and system for measuring a surface of an object comprising different structures using low coherence interferometry (2024-02-20),

13. 11849593 - Vertical cross-point arrays for ultra-high-density memory applications (2023-12-19),

14. 11713960 - Method and system for measuring a surface of an object comprising different structures using low coherence interferometry (2023-08-01),

15. 11398256 - Local bit lines and methods of selecting the same to access memory elements in cross-point arrays (2022-07-26),

Unity Semiconductor Corporation specializes in the development and manufacture of advanced semiconductor memory solutions. With a focus on innovation, Unity Semiconductor delivers high-performance memory products for various industries, including automotive, consumer electronics, and enterprise storage. Their cutting-edge technologies provide enhanced reliability, scalability, and power efficiency to meet the growing demands of data storage and processing. Visit their website to learn more about Unity Semiconductor Corporation and their groundbreaking memory solutions.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

299 Patents

#49 in San Jose, CA

#312 in California

#1,400 in US

#2,891 in the World

San Jose, CA, United States of America

Unity Semiconductor Corporation

Forward Citations = 4,941

73 inventors:

Christophe J Chevallier (119 out of 311 patents)

Darrell Rinerson (93 out of 100 patents)

Robert D Norman (90 out of 229 patents)

4. Chang Hua Siau (68 out of 106 patents)

5. Wayne I Kinney (51 out of 116 patents)

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