Justin Lloyd Kreuzer

USPTO Granted Patents = 64 (Patent Applications = 9)

CIPO Patents = 1 (Patent Applications = 3)

EPO Patents = 1

Average Co-Inventor Count = 2.2

ph-index = 14

Forward Citations = 573(Granted Patents)

Inventors with similar research interests:

Location History:

Trumball, CT (US) (2006 - 2008)
Wilton, CT (US) (2018)
Trumbull, CT (US) (1982 - 2024)

Company Filing History:

Asml Netherlands B.v.

patents

4 out of 801

The Perkin-elmer Corporation

patents

4. 3 out of 35

Svg Lithography Systems, Inc.

Silicon Valley Group, Inc.

8. 1 out of 832,680

Other

patents

where one patent can have more than one assignee

Years Active: 1982-2025

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64 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 12405535 - Method for filtering an image and associated metrology apparatus (2025-09-02),

2. 12405227 - Method for region of interest processing for reticle particle detection (2025-09-02),

3. 12399000 - Systems and methods for measuring intensity in a lithographic alignment apparatus (2025-08-26),

4. 12379655 - Contaminant identification metrology system, lithographic apparatus, and methods thereof (2025-08-05),

5. 12298257 - Monolithic particle inspection device (2025-05-13),

6. 12216414 - Self-referencing integrated alignment sensor (2025-02-04),

7. 12135505 - Spectrometric metrology systems based on multimode interference and lithographic apparatus (2024-11-05),

8. 12124177 - Overlay measurement system using lock-in amplifier technique (2024-10-22),

9. 11994808 - Lithographic apparatus, metrology systems, phased array illumination sources and methods thereof (2024-05-28),

10. 11841628 - Apparatus for and method of sensing alignment marks (2023-12-12),

11. 11662198 - Optical arrangement for an inspection apparatus (2023-05-30),

12. 11531280 - Compact alignment sensor arrangements (2022-12-20),

13. 11526091 - Sensor apparatus and method for lithographic measurements (2022-12-13),

14. 11175593 - Alignment sensor apparatus for process sensitivity compensation (2021-11-16),

15. 10908516 - Metrology tool and method of using the same (2021-02-02),

As an AI assistant specializing in innovations, inventions, inventors, patent attorneys, assignees, and patents, I focus on providing information related to these fields.

Title: The Innovative Mind of Justin Lloyd Kreuzer

Introduction: Justin Lloyd Kreuzer, a prolific inventor hailing from Trumbull, CT (US), has made significant contributions to the field of technology with a remarkable 57 patents to his name.

Latest Patents: Among his latest patents are groundbreaking innovations in lithographic apparatus, metrology systems, phased array illumination sources, and associated methods. This system features radiation sources, phased arrays with optical elements, waveguides, and phase modulators to generate and direct radiation beams towards target structures for precise measurements.

Career Highlights: Justin Lloyd Kreuzer has demonstrated his expertise while working at prominent companies like ASML Holding N.V. and ASML Netherlands B.V. His inventive spirit and dedication to technological advancements have been evident throughout his career.

Collaborations: Justin has had the opportunity to collaborate with talented individuals such as Arie Jeffrey Den Boef and Krishanu Shome, further enhancing his innovative projects and expanding the realms of possibility in the realm of technology.

Conclusion: In conclusion, Justin Lloyd Kreuzer's impressive patent portfolio and successful career trajectory exemplify his commitment to pushing the boundaries of innovation in the technological landscape. His contributions continue to inspire the next generation of inventors and shape the future of technology.

This text is generated by artificial intelligence and may not be accurate.