The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Jun. 07, 2023
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Saman Jahani, Stamford, CT (US);

Roxana Rezvani Naraghi, Easton, CT (US);

Stephen Roux, New Fairfield, CT (US);

Justin Lloyd Kreuzer, Trumbull, CT (US);

Jorn Paul Van Engelen, Eindhoven, NL;

Assignee:

ASML NETHERLANDS B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/706851 (2023.05); G03F 7/70641 (2013.01); G03F 7/706837 (2023.05); G03F 7/706845 (2023.05);
Abstract

An inspection system includes a radiation source, an integrated optical system, and first and second detectors. The radiation source generates radiation to irradiate a target. The integrated optical system includes: a substrate; first, second, third, and fourth waveguides; first and second grating couplers; a first combiner coupled to the first and second waveguides; and a second combiner coupled to the third and fourth waveguides. The first grating coupler couples first and third portions of radiation scattered by the target respectively into the first and third waveguides. The second grating coupler couples second and fourth portions of radiation scattered by the target respectively into the second and fourth waveguides. The first combiner can combine the first and second portions of radiation. The second combiner can combine the third and fourth portions of radiation. The first and second detectors generate measurement signals based on the corresponding combined portions of radiation.


Find Patent Forward Citations

Jahani, Saman. (2026). Integrated optical system for scalable and accurate inspection systems (U.S. Patent No. 12754485). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754485

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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