Eindhoven, Netherlands

Jorn Paul Van Engelen

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Asml Netherlands B.v.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jorn Paul Van Engelen. Retrieved from https://idiyas.com/inventor/jorn-paul-van-engelen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jorn Paul Van Engelen: Inventor in Optical Inspection Systems.

Introduction

Jorn Paul Van Engelen is an inventor associated with Eindhoven, the Netherlands. His recorded patent work includes an optical system designed to support scalable and accurate inspection.

Latest Patents

Van Engelen is listed as an inventor on 1 patent: “Integrated Optical System for Scalable and Accurate Inspection Systems.” The invention describes an inspection system in which a radiation source illuminates a target, while an integrated optical system uses waveguides, grating couplers, and combiners to collect and combine portions of radiation scattered by the target. Two detectors then generate measurement signals from the combined radiation, supporting inspection measurements.

Career Highlights

Van Engelen is associated with ASML Netherlands B.V., a company working in semiconductor manufacturing technology. His patent reflects work on integrated optics for inspection systems, with an architecture intended to collect and process scattered radiation.

Collaborations

The patent lists Roxana Rezvani Naraghi and Stephen Roux among Van Engelen’s coworkers. Their shared association provides context for the professional environment connected with his invention.

Conclusion

Jorn Paul Van Engelen’s recorded patent contribution focuses on integrated optical components for scalable and accurate inspection, linking his inventive work with ASML Netherlands B.V.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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