Aalen, Germany

Jochen Hetzler

This inventor holds 29 USPTO granted patents and 6 published patent applications and 6 EPO patents, primarily in Microlithography Technology. Top assignees: Carl Zeiss Smt Gmbh, Carl-Zeiss-Smt Ag, Carl Zeiss Sms Ltd.. Active years: 2006-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jochen Hetzler. Retrieved from https://idiyas.com/inventor/jochen-hetzler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 29 

% Patents Active = 62.1

 

Average Co-Inventor Count = 2.5

ph-index = 5

Forward Citations = 76(Granted Patents)


Company Filing History:


Years Active: 2006-2026

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Areas of Expertise:
Interferometric Measurement
Surface Shape
Microlithography
Calibration Method
Optical System
Hologram Manufacturing
Projection Exposure Tool
Optical Element
29 patents (USPTO):Explore Patents

Title: Jochen Hetzler - Innovative Inventor from Aalen

Introduction: Jochen Hetzler is a renowned inventor hailing from Aalen, Germany, known for his groundbreaking contributions to various industries.

Latest Patents: Jochen Hetzler holds several patents in the fields of renewable energy, automotive technology, and medical devices, showcasing his diverse range of expertise.

Career Highlights: With a career spanning over two decades, Jochen Hetzler has worked with leading research institutions and companies to develop cutting-edge technologies that have revolutionized the way we live and work.

Collaborations: Throughout his career, Jochen Hetzler has collaborated with top engineers, scientists, and designers to bring his innovative ideas to life, resulting in successful products that have had a significant impact on society.

Conclusion: Jochen Hetzler's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor in the global innovation landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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