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Sii Nanotechnology Inc.

USPTO Granted Patents = 223

% Expired Patents = 48.0

EPO Patents = 5

Trademarks = 3

Forward Citations = 978

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159 inventors (with patents filed for the assignee):

Toshiaki Fujii (21 out of 37 patents)

Masatoshi Yasutake (20 out of 50 patents)

Yoshiki Matoba (19 out of 33 patents)

4. Kouji Iwasaki (17 out of 20 patents)

5. Osamu Takaoka (16 out of 22 patents)

6. Masato Iyoki (16 out of 17 patents)

7. Junichi Tashiro (15 out of 17 patents)

8. Yutaka Ikku (13 out of 18 patents)

9. Kazutoshi Watanabe (12 out of 80 patents)

10. Takashi Ogawa (12 out of 65 patents)

11. Masatsugu Shigeno (11 out of 26 patents)

12. Takashi Kaito (10 out of 23 patents)

13. Yo Yamamoto (9 out of 21 patents)

14. Naoya Watanabe (9 out of 26 patents)

15. Yasuhiko Sugiyama (8 out of 44 patents)

Core Competencies:

X-Ray Analyzer

Focused Ion Beam

Scanning Probe Microscope

Charged Particle Beam

Thermal Analyzer

Differential Scanning Calorimeter

Sample Processing

Optical Displacement Detection

Electron Microscope

Vibration Measurement

Element Mapping

Micro Cross-Section Processing

223 patents: Sort by Forward Citations

1. 8912503 - Transmission X-ray analyzer and transmission X-ray analysis method (2014-12-16),

2. 8891729 - X-ray analyzer and X-ray analysis method (2014-11-18),

3. 8869311 - Displacement detection mechanism and scanning probe microscope using the same (2014-10-21),

4. 8822945 - Focused ion beam apparatus (2014-09-02),

5. 8728286 - Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same (2014-05-20),

6. 8719959 - Cantilever, cantilever system, and probe microscope and adsorption mass sensor including the cantilever system (2014-05-06),

7. 8708556 - Thermal analyzer (2014-04-29),

8. 8705698 - X-ray analyzer and mapping method for an X-ray analysis (2014-04-22),

9. 8703247 - Cross section processing method and method of manufacturing cross section observation sample (2014-04-22),

10. 8698105 - Charged particle beam apparatus and method of adjusting charged particle optics (2014-04-15),

11. 8664598 - Electron microscope and specimen analyzing method (2014-03-04),

12. 8642958 - Composite charged particle beam apparatus and sample processing and observing method (2014-02-04),

13. 8615811 - Method of measuring vibration characteristics of cantilever (2013-12-24),

14. 8611493 - X-ray fluorescence analyzer and X-ray fluorescence analysis method (2013-12-17),

15. 8608373 - Softening point measuring apparatus and thermal conductivity measuring apparatus (2013-12-17),

Company Overview

Sii Nanotechnology Inc. is a prominent player in the field of X-Ray analysis, headquartered in Chiba, Japan. The company specializes in the development and manufacturing of advanced analytical instruments, including X-Ray analyzers, focused ion beams, and scanning probe microscopes. Their technology portfolio also encompasses charged particle beams, thermal analyzers, and differential scanning calorimeters, catering to a wide range of applications in materials science and engineering. Sii Nanotechnology is committed to innovation in sample processing and optical displacement detection, providing cutting-edge solutions for research and industrial needs.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

223 Patents

#6 in Chiba

#658 in Japan

#3,828 in the World

Sii Nanotechnology Inc.

Forward Citations = 978

159 inventors:

Toshiaki Fujii (21 out of 37 patents)

Masatoshi Yasutake (20 out of 50 patents)

Yoshiki Matoba (19 out of 33 patents)

4. Kouji Iwasaki (17 out of 20 patents)

5. Osamu Takaoka (16 out of 22 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Sii Nanotechnology Inc.. Retrieved from https://idiyas.com/company/sii-nanotechnology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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