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Sii Nanotechnology Inc.

USPTO Granted Patents = 223

EPO Patents = 5

Trademarks = 4

Forward Citations = 948

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169 inventors (with patents filed for the assignee):

Toshiaki Fujii (21 out of 37 patents)

Masatoshi Yasutake (20 out of 50 patents)

Yoshiki Matoba (19 out of 33 patents)

4. Kouji Iwasaki (17 out of 20 patents)

5. Osamu Takaoka (16 out of 22 patents)

6. Masato Iyoki (16 out of 17 patents)

7. Junichi Tashiro (15 out of 17 patents)

8. Yutaka Ikku (13 out of 18 patents)

9. Kazutoshi Watanabe (12 out of 75 patents)

10. Takashi Ogawa (12 out of 63 patents)

11. Masatsugu Shigeno (11 out of 26 patents)

12. Takashi Kaito (10 out of 23 patents)

13. Yo Yamamoto (9 out of 21 patents)

14. Naoya Watanabe (9 out of 26 patents)

15. Yasuhiko Sugiyama (8 out of 43 patents)

Core Competencies:

X-Ray Analyzer

Focused Ion Beam Apparatus

Scanning Probe Microscope

Charged Particle Beam Apparatus

Thermal Analyzer

Electron Microscope

Differential Scanning Calorimeter

Sample Processing Method

Element Mapping Apparatus

Defect Repair Apparatus

Transmission Electron Microscope

Viscoelasticity Measuring Instrument

223 patents: Sort by Forward Citations

1. 8912503 - Transmission X-ray analyzer and transmission X-ray analysis method (2014-12-16),

2. 8891729 - X-ray analyzer and X-ray analysis method (2014-11-18),

3. 8869311 - Displacement detection mechanism and scanning probe microscope using the same (2014-10-21),

4. 8822945 - Focused ion beam apparatus (2014-09-02),

5. 8728286 - Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same (2014-05-20),

6. 8719959 - Cantilever, cantilever system, and probe microscope and adsorption mass sensor including the cantilever system (2014-05-06),

7. 8708556 - Thermal analyzer (2014-04-29),

8. 8705698 - X-ray analyzer and mapping method for an X-ray analysis (2014-04-22),

9. 8703247 - Cross section processing method and method of manufacturing cross section observation sample (2014-04-22),

10. 8698105 - Charged particle beam apparatus and method of adjusting charged particle optics (2014-04-15),

11. 8664598 - Electron microscope and specimen analyzing method (2014-03-04),

12. 8642958 - Composite charged particle beam apparatus and sample processing and observing method (2014-02-04),

13. 8615811 - Method of measuring vibration characteristics of cantilever (2013-12-24),

14. 8611493 - X-ray fluorescence analyzer and X-ray fluorescence analysis method (2013-12-17),

15. 8608373 - Softening point measuring apparatus and thermal conductivity measuring apparatus (2013-12-17),

SII NanoTechnology Inc. is a leading technology company specializing in nanotechnology research and development. With a focus on groundbreaking innovations, we strive to create advanced materials and devices at the nano-scale. Our team of experts is dedicated to pushing the boundaries of scientific understanding and applying nanotechnology to various industries such as electronics, healthcare, and renewable energy. Visit our website to learn more about our cutting-edge solutions and the impact of nanotechnology on the future.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

223 Patents

#17 in

#634 in Japan

#3,708 in the World

Sii Nanotechnology Inc.

Forward Citations = 948

169 inventors:

Toshiaki Fujii (21 out of 37 patents)

Masatoshi Yasutake (20 out of 50 patents)

Yoshiki Matoba (19 out of 33 patents)

4. Kouji Iwasaki (17 out of 20 patents)

5. Osamu Takaoka (16 out of 22 patents)

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