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Yasuhiko Sugiyama

This inventor holds 44 USPTO granted patents and 6 published patent applications, primarily in Focused Ion Beam Technology. Top assignees: Hitachi High-Tech Science Corporation, Seiko Instruments Inc, Sii Nanotechnology Inc.. Active years: 1995-2026.

USPTO Granted Patents = 44 (Patent Applications = 6)

% Patents Active = 68.2

Average Co-Inventor Count = 2.9

ph-index = 6

Forward Citations = 139(Granted Patents)

Location History:

Chiba, JP (1999 - 2015)
Tokyo, JP (1995 - 2023)

Company Filing History:

22 out of 225

Hitachi High-Tech Science Corporation

patents

12 out of 2,903

Seiko Instruments Inc

patents

8 out of 223

Sii Nanotechnology Inc.

patents

4. 2 out of 2,874

Hitachi-High-Technologies Corporation

patents

Years Active: 1995-2026

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Areas of Expertise:

Focused Ion Beam

Charged Particle Beam

Plasma Ion Source

Electron Microscope

Ion Beam Processing

Emitter Structure

Sample Transfer

Photomask Correction

Ion Beam Apparatus

Gas Field Ion Source

Mask Repair Apparatus

Composite Focused Ion Beam

44 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12731755 - Focused ion beam device (2026-09-08),

2. 11721517 - Focused ion beam processing apparatus (2023-08-08),

3. 11276555 - Charged particle beam apparatus, composite charged particle beam apparatus, and control method for charged particle beam apparatus (2022-03-15),

4. 11257655 - Focused ion beam apparatus, and control method for focused ion beam apparatus (2022-02-22),

5. 11017988 - Charged particle beam apparatus (2021-05-25),

6. 11017982 - Composite charged particle beam apparatus and control method thereof (2021-05-25),

7. 10176964 - Focused ion beam apparatus (2019-01-08),

8. 10056232 - Charged particle beam apparatus and plasma ignition method (2018-08-21),

9. 9793085 - Focused ion beam apparatus (2017-10-17),

10. 9773646 - Plasma ion source and charged particle beam apparatus (2017-09-26),

11. 9773637 - Plasma ion source and charged particle beam apparatus (2017-09-26),

12. 9773634 - Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus (2017-09-26),

13. 9640361 - Emitter structure, gas ion source and focused ion beam system (2017-05-02),

14. 9583299 - Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus (2017-02-28),

15. 9418817 - Focused ion beam apparatus and control method thereof (2016-08-16),

Title: The Innovative Mind of Yasuhiko Sugiyama

Introduction: Yasuhiko Sugiyama is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Yasuhiko Sugiyama holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Sugiyama has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant advancements in various industries.

Collaborations: Throughout his career, Yasuhiko Sugiyama has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge exchange.

Conclusion: Yasuhiko Sugiyama's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of technology worldwide.

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