This inventor holds 26 USPTO granted patents, primarily in Scanning Probe Microscopy. Top assignees: Sii Nanotechnology Inc., Hitachi High-Tech Science Corporation, Seiko Instruments Inc. Active years: 1990-2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Chiba, JP (2006 - 2014)
- Tokyo, JP (1990 - 2022)
Company Filing History:
11 out of 223 
10 out of 225 
5 out of 2,903 
Years Active: 1990-2022
Areas of Expertise:
Title: The Innovator Masatsugu Shigeno: Advancements in Scanning Probe Microscopy
Introduction: Masatsugu Shigeno, an accomplished inventor based in Chiba, Japan, is renowned for his significant contributions in the field of scanning probe microscopy. With a remarkable portfolio of 26 patents, Shigeno has dedicated his career to improving measurement technologies and methodologies.
Latest Patents: Among his latest innovations is a scanning probe microscope that incorporates a movement driving unit enabling the relative movement of a cantilever and a sample in at least a z direction. This design optimizes the approach operation by ensuring the cantilever and sample can approach each other at a predetermined speed. This method reduces the measuring time significantly, while also implementing a safety mechanism to prevent excessive force on the sample during contact.
Another notable patent is related to a scanning probe microscope and scanning method that emphasizes the importance of minimizing overload on both the probe and the sample surface. This system executes an intermittent measurement method to accurately scan irregular shapes, separating the probe and sample through thermal deformation of the cantilever.
Career Highlights: Masatsugu Shigeno's career spans impressive tenures at leading technology companies. He has worked at Sii Nanotechnology Inc. and Hitachi High-Tech Science Corporation, where he contributed to pioneering research and development projects in advanced microscopy and nanotechnology.
Collaborations: Throughout his career, Shigeno has collaborated with noteworthy colleagues such as Kazutoshi Watanabe and Masato Iyoki. These collaborations have played a significant role in the advancement of scanning probe technologies, allowing for shared expertise and resources.
Conclusion: Masatsugu Shigeno exemplifies innovation and dedication in the realm of scanning probe microscopy. His latest patents and his collaborative efforts in esteemed companies highlight his commitment to advancing technology and addressing the challenges posed by measurement in the nanotechnology sector. As he continues to push the boundaries of research, the scientific community eagerly anticipates his future contributions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile