The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2017
Filed:
Mar. 27, 2015
Applicant:
Hitachi High-tech Science Corporation, Minato-ku, Tokyo, JP;
Inventor:
Masatsugu Shigeno, Tokyo, JP;
Assignee:
HITACHI HIGH-TECH SCIENCE CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/12 (2010.01); G01Q 70/02 (2010.01); G01Q 70/10 (2010.01);
U.S. Cl.
CPC ...
G01Q 70/02 (2013.01); G01Q 70/10 (2013.01);
Abstract
A scanning probe microscope includes a cantilever that has a first attachment surface and a cantilever attachment portion that has a second attachment surface to which the first attachment surface of the cantilever is attached. Columnar elements including nanofibers or nanotubes are formed on the second attachment surface, and the second attachment surface adheres to the first attachment surface by using the columnar element.
Shigeno, Masatsugu. (2017). Scanning probe microscope (U.S. Patent No. 9645170). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9645170
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile