The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Jun. 07, 2007
Amiko Nihei, Chiba, JP;
Masatsugu Shigeno, Chiba, JP;
Yoshiharu Shirakawabe, Chiba, JP;
Akira Inoue, Chiba, JP;
Osamu Matsuzawa, Chiba, JP;
Naoya Watanabe, Chiba, JP;
Amiko Nihei, Chiba, JP;
Masatsugu Shigeno, Chiba, JP;
Yoshiharu Shirakawabe, Chiba, JP;
Akira Inoue, Chiba, JP;
Osamu Matsuzawa, Chiba, JP;
Naoya Watanabe, Chiba, JP;
Abstract
A cell detachment method for detaching only a desired cell from a plurality of cells cultured on a substrate under predetermined culture environment conditions by using a scanning probe microscope having a probe, comprising: observing the plural cells; specifying the cell to be detached; moving the probe onto the specified cell; and pressing the prove against the specified cell with a predetermined force so as to detach the cell from the substrate.