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For the Inventor, By the Inventor

Chiba, Japan

Yoshiharu Shirakawabe

This inventor holds 25 USPTO granted patents and 1 EPO patent, primarily in Scanning Probe Microscopy. Top assignees: Seiko Instruments Inc, Sii Nanotechnology Inc., Daiken Chemical Co., Ltd.. Active years: 1999-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshiharu Shirakawabe. Retrieved from https://idiyas.com/inventor/yoshiharu-shirakawabe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 25

% Patents Active = 64.0

 

Average Co-Inventor Count = 4.2

ph-index = 8

Forward Citations = 173(Granted Patents)


Location History:

  • Sunto-gun, JP (2004)
  • Shizuoka, JP (2008)
  • Chiba, JP (1999 - 2014)

Company Filing History:

goldMedal13 out of 2,903 
 
Seiko Instruments Inc
 patents
silverMedal7 out of 223 
 
Sii Nanotechnology Inc.
 patents
bronzeMedal1 out of 21 
 
Daiken Chemical Co., Ltd.
 patents
4. 1 out of 225 
 
Hitachi High-Tech Science Corporation
 patents
5. 5 out of 834,570 
Other
 patents
where one patent can have more than one assignee

Years Active: 1999-2014

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Areas of Expertise:
Scanning Probe Microscope
Cantilever
Surface Analysis
Microprobe
Semiconductor Strain Sensor
Atomic Force Microscope
Fabrication Method
Nanometer-Scale Structure
Multi-Tip Probe
Self-Detecting Probe
Correlation Sample
Focused Ion Beam Machining
25 patents (USPTO):Explore Patents
1. 8859279 - Cell detachment method (2014-10-14),
2. 7823470 - Cantilever and cantilever manufacturing method (2010-11-02),
3. 7494575 - Method for manufacturing a split probe (2009-02-24),
4. 7476418 - Method for fabricating nanometer-scale structure (2009-01-13),
5. 7456400 - Scanning probe microscope and scanning method (2008-11-25),
6. 7398678 - Probe for a scanning microscope (2008-07-15),
7. 7337656 - Surface characteristic analysis apparatus (2008-03-04),
8. 6953519 - Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus (2005-10-11),
9. 6941798 - Scanning probe microscope and operation method (2005-09-13),
10. 6932504 - Heated self-detecting type cantilever for atomic force microscope (2005-08-23),
11. 6787769 - Conductive probe for scanning microscope and machining method using the same (2004-09-07),
12. 6759653 - Probe for scanning microscope produced by focused ion beam machining (2004-07-06),
13. 6705154 - Cantilever for vertical scanning microscope and probe for vertical scan microscope (2004-03-16),
14. 6667467 - Microprobe and scanning probe apparatus having microprobe (2003-12-23),
15. 6664540 - Microprobe and sample surface measuring apparatus (2003-12-16),

Title: Yoshiharu Shirakawabe: Pioneering Inventor from Chiba, JP

Introduction: Yoshiharu Shirakawabe is a renowned inventor hailing from Chiba, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Shirakawabe holds several patents in the areas of robotics, artificial intelligence, and sustainable energy solutions, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Shirakawabe has worked with leading tech companies in Japan, spearheading projects that have revolutionized industries and improved the quality of life for many.

Collaborations: Throughout his career, Shirakawabe has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge-sharing.

Conclusion: Yoshiharu Shirakawabe's dedication to pushing the boundaries of technology and his passion for creating solutions that make a difference have solidified his reputation as a visionary inventor in Chiba, Japan, and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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