The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 2005
Filed:
Sep. 16, 2003
Takehiro Yamaoka, Chiba, JP;
Kazutoshi Watanabe, Chiba, JP;
Kazunori Ando, Chiba, JP;
Yoshiharu Shirakawabe, Chiba, JP;
Takehiro Yamaoka, Chiba, JP;
Kazutoshi Watanabe, Chiba, JP;
Kazunori Ando, Chiba, JP;
Yoshiharu Shirakawabe, Chiba, JP;
SII NanoTechnology Inc., Chiba, JP;
Abstract
A scanning probe is microscope has a cantilever having a probe at a disal end thereof and an oscillator for generating a resonance signal near a resonance of the cantilever. A vibrating device receives the resonance signal as a driving signal for vibrating the cantilever. A variable gain amplifier adjusts a gain of displacement signal corresponding to displacement of the vibrating cantilever so as to satisfy the equation G=(A/A)*Gto control a quality factor value of the cantilever resonance to an optimal quality factor value, where G represents a gain value of the variable gain amplifer, A represents a preselected oscillation amplitude of the oscillator, Arepresents an initial oscillation amplitude of the oscillator, and Grepresents a gain value of the variable gain amplifier when the initial oscillation amplitude of the oscillator is A.