The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6787769 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 07, 2004

Filed:

Jul. 26, 2002
Applicant:
Inventors:

Yoshikazu Nakayama, Hirakata City Osaka, JP;

Seiji Akita, Izumi, JP;

Akio Harada, Osaka, JP;

Takashi Okawa, Osaka, JP;

Yuichi Takano, Osaka, JP;

Masatoshi Yasutake, Sunto-gun, JP;

Yoshiharu Shirakawabe, Sunto-gun, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/300 ;
U.S. Cl.
CPC ...
G01N 2/300 ;
Abstract

A conductive probe for a scanning type microscope that captures the substance information of the surface of a specimen by the tip end of a conductive nanotube probe needle fastened to a cantilever, in which the conductive probe is constructed from a conductive film formed on the surface of the cantilever, a conductive nonatube with its base end portion being fixed in contact which the surface of a predetermined of the cantilever, and a conductive deposit which fastens the conductive nanotube by covering from the base end portion of the nonatube to a part of the conductive film. The conductive nonatube and the conductive film are electrically connected to each other by the conductive deposit.


Find Patent Forward Citations

Nakayama, Yoshikazu. (2004). Conductive probe for scanning microscope and machining method using the same (U.S. Patent No. 6787769). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6787769

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…