The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2004
Filed:
Jul. 26, 2002
Yoshikazu Nakayama, Hirakata, JP;
Seiji Akita, Izumi, JP;
Akio Harada, Osaka, JP;
Takashi Okawa, Osaka, JP;
Yuichi Takano, Osaka, JP;
Masatoshi Yasutake, Sunto-gun, JP;
Yoshiharu Shirakawabe, Sunto-gun, JP;
Other;
Abstract
A cantilever for a vertical scanning type microscope that obtains substance information of a surface of a specimen by a tip end of a nanotube probe needle fastened to the cantilever, in which the cantilever has a fixing region to which a base end portion of a nanotube serving as a probe needle is fastened, and a height direction of the fixing region is set to be substantially perpendicular to a mean surface of the specimen when the cantilever is disposed in a measuring state with respect to the mean surface of the specimen; and the base end portion of the nanotube is bonded in the height direction of the fixing region.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile