The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
Aug. 11, 2010
Kazunori Ando, Chiba, JP;
Masayuki Iwasa, Chiba, JP;
Masatsugu Shigeno, Chiba, JP;
Hiroumi Momota, Chiba, JP;
Kazutoshi Watanabe, Chiba, JP;
Kazunori Ando, Chiba, JP;
Masayuki Iwasa, Chiba, JP;
Masatsugu Shigeno, Chiba, JP;
Hiroumi Momota, Chiba, JP;
Kazutoshi Watanabe, Chiba, JP;
SII NanoTechnology Inc., , JP;
Abstract
In a local softening point measuring apparatus and thermal conductivity measuring apparatus using a probe microscope as a base, environment of the proband a sample surface is set to 1/100 atmospheric pressure (103 Pa) or lower. Otherwise, a side surface of the probe is coated with a thermal insulation material having a thickness that enables thermal dissipation to be reduced to 1/100 or lower, to thereby reduce the thermal dissipation from the side surface of the probe, and exchange heat substantially only at the contacting portion between the probe and the sample surface.