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For the Inventor, By the Inventor

Chiba, Japan

Junichi Tashiro

This inventor holds 17 USPTO granted patents, primarily in Focused Ion Beam Technology. Top assignees: Sii Nanotechnology Inc., Sll Nano Technology Inc., Aoi Electronics Co., Ltd.. Active years: 2007-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Junichi Tashiro. Retrieved from https://idiyas.com/inventor/junichi-tashiro

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 17

% Patents Active = 94.1

Average Co-Inventor Count = 3.3

ph-index = 3

Forward Citations = 31(Granted Patents)


Company Filing History:

goldMedal15 out of 223 
 
Sii Nanotechnology Inc.
 patents
silverMedal2 out of 2 
 
Sll Nano Technology Inc.
 patents
bronzeMedal1 out of 32 
 
Aoi Electronics Co., Ltd.
 patents
where one patent can have more than one assignee

Years Active: 2007-2014

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Areas of Expertise:
Electron Microscope
Sample Processing
Focused Ion Beam
Charged Particle Beam
Atomic Force Microscope
Cross-Section Processing
Particle Removal
Micro-Structure Measurement
Photomask Correction
Sample Relocation
Composite Device
Observation Method
17 patents (USPTO):Explore Patents
1. 8664598 - Electron microscope and specimen analyzing method (2014-03-04),
2. 8657962 - Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus (2014-02-25),
3. 8581206 - Focused ion beam system and sample processing method using the same (2013-11-12),
4. 8542275 - Method and apparatus for cross-section processing and observation (2013-09-24),
5. 8426830 - Focused ion beam apparatus, sample processing method using the same, and computer program for focused ion beam processing (2013-04-23),
6. 8306264 - Section processing method and its apparatus (2012-11-06),
7. 8274063 - Composite focused ion beam device, process observation method using the same, and processing method (2012-09-25),
8. 8274049 - Sample processing and observing method (2012-09-25),
9. 8269194 - Composite focused ion beam device, and processing observation method and processing method using the same (2012-09-18),
10. 8198603 - Sample preparing device and sample posture shifting method (2012-06-12),
11. 7923267 - Method of measuring length of measurement object article in micro-structure (2011-04-12),
12. 7872231 - Sample relocation method in charged particle beam apparatus and charged particle beam apparatus as well as sample for transmission electron microscope (2011-01-18),
13. 7755044 - Apparatus for working and observing samples and method of working and observing cross sections (2010-07-13),
14. 7595488 - Method and apparatus for specifying working position on a sample and method of working the sample (2009-09-29),
15. 7531796 - Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods (2009-05-12),

Title: Innovations of Junichi Tashiro

Introduction

Junichi Tashiro is a prominent inventor based in Chiba, Japan. He has made significant contributions to the field of nanotechnology and microscopy, holding a total of 17 patents. His work focuses on advanced imaging techniques and particle manipulation methods, which have applications in various scientific and industrial fields.

Latest Patents

One of Tashiro's latest patents is an electron microscope and specimen analyzing method. This invention features a focused ion beam column that intersects with an electron beam, allowing for enhanced imaging capabilities. A backscattered electron detector is strategically positioned to detect backscattered electrons released from the surface of the specimen, improving the analysis of materials at the nanoscale.

Another notable patent involves a particle removing method and device, as well as an atomic force microscope and charged particle beam apparatus. This invention utilizes small tweezers with openable and closable arms to grip and transfer particles from a sample to an adhesion member. The device includes a driving unit for the tweezers and a moving mechanism that facilitates the transfer process, showcasing Tashiro's innovative approach to particle manipulation.

Career Highlights

Throughout his career, Junichi Tashiro has worked with several companies, including Sii Nanotechnology Inc. and Sll Nano Technology Inc. His expertise in nanotechnology has positioned him as a key figure in the development of advanced imaging and particle manipulation technologies.

Collaborations

Tashiro has collaborated with notable colleagues such as Toshiaki Fujii and Makoto Sato. These partnerships have contributed to the advancement of his research and the successful development of his patented technologies.

Conclusion

Junichi Tashiro's contributions to the fields of microscopy and nanotechnology are significant, with a focus on innovative methods for particle analysis and manipulation. His patents reflect a commitment to advancing scientific understanding and technological capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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