Company Filing History:

17 out of 223

Sii Nanotechnology Inc.

patents

2 out of 2,899

Seiko Instruments Inc

patents

2 out of 32

Aoi Electronics Co., Ltd.

patents

4. 1 out of 832,880

Other

patents

where one patent can have more than one assignee

Years Active: 2002-2014

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20 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8657962 - Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus (2014-02-25),

2. 8581206 - Focused ion beam system and sample processing method using the same (2013-11-12),

3. 8304721 - Micro cross-section processing method (2012-11-06),

4. 8269194 - Composite focused ion beam device, and processing observation method and processing method using the same (2012-09-18),

5. 8191168 - Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscope (2012-05-29),

6. 7973280 - Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same (2011-07-05),

7. 7736893 - Nanobio device of imitative anatomy structure (2010-06-15),

8. 7626165 - Focused ion beam apparatus and method of preparing/observing sample (2009-12-01),

9. 7442942 - Charged particle beam apparatus (2008-10-28),

10. 7404339 - Probe and small sample pick up mechanism (2008-07-29),

11. 7345289 - Sample support prepared by semiconductor silicon process technique (2008-03-18),

12. 7297944 - Ion beam device and ion beam processing method, and holder member (2007-11-20),

13. 7276691 - Ion beam device and ion beam processing method (2007-10-02),

14. 7267731 - Method and system for fabricating three-dimensional microstructure (2007-09-11),

15. 7067823 - Micro-sample pick-up apparatus and micro-sample pick-up method (2006-06-27),

Title: Kouji Iwasaki: Innovating Particle Manipulation Technologies

Introduction

Kouji Iwasaki, hailing from Chiba, Japan, is an accomplished inventor with a remarkable portfolio of 20 patents. His innovations primarily focus on advanced methods and devices for particle manipulation, which have significant implications in various scientific and technological fields.

Latest Patents

Iwasaki's latest patents include a Particle Removing Method and Particle Removing Device. The device is designed to facilitate the gripping and removal of particles from surfaces, utilizing small tweezers with openable and closable arms. This innovative mechanism allows the removal of particles by gripping them and attaching them to an adhesion member. Upon positioning the small tweezers closer to the sample, they effectively carry the particle to the adhesion member and then release it, ensuring precise handling of delicate materials.

Additionally, Iwasaki has developed an Atomic Force Microscope and Charged Particle Beam Apparatus that incorporates his particle removing device, enhancing the capabilities of these advanced tools. One significant innovation is the Focused Ion Beam System, which integrates a sample holder and microtweezers that can operate at predetermined angles, allowing for meticulous sample processing.

Career Highlights

Throughout his career, Kouji Iwasaki has contributed his expertise to notable companies such as Sii Nanotechnology Inc. and Seiko Instruments Inc. His work has played a pivotal role in the development of cutting-edge technologies that continue to push the boundaries of particle manipulation and microscopy.

Collaborations

Working alongside professionals such as Toshiaki Fujii and Yo Yamamoto, Iwasaki has been part of a collaborative effort to advance the field of particle manipulation technology. These partnerships have led to pioneering inventions that meet the demands of modern scientific research.

Conclusion

Kouji Iwasaki is a notable inventor whose contributions to the field of particle manipulation and microscopy shape the future of scientific exploration. With an impressive collection of patents and a career marked by collaboration with other innovators, his work continues to impact various industries and research institutions around the world.

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