The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2008
Filed:
Jul. 15, 2005
Masanao Munekane, Chiba, JP;
Kouji Iwasaki, Chiba, JP;
Takashi Konno, Takamatsu, JP;
Hiroki Hayashi, Takamatsu, JP;
Masanao Munekane, Chiba, JP;
Kouji Iwasaki, Chiba, JP;
Takashi Konno, Takamatsu, JP;
Hiroki Hayashi, Takamatsu, JP;
SII Nano Technology Inc., Chiba, JP;
AOI Electronics Co., Ltd., Kagawa, JP;
Abstract
A probe mechanism and a sample pick up mechanism of the invention are provided at an observing apparatus or an analyzing apparatus and characterized in including a tip member comprising a needle-like member brought into contact with a sample, including a driving electrostatic actuator and means for monitoring a change in an electrostatic capacitance between electrodes of the electrostatic actuator, and capable of sensing that the probe is brought into contact with a sample by the monitor.