The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2007

Filed:

Aug. 20, 2003
Applicants:

Toshio Kodama, Chiba, JP;

Masakatsu Hasuda, Chiba, JP;

Toshiaki Fujii, Chiba, JP;

Kouji Iwasaki, Chiba, JP;

Yasuhiko Sugiyama, Chiba, JP;

Yasuyuki Takagi, Chiba, JP;

Inventors:

Toshio Kodama, Chiba, JP;

Masakatsu Hasuda, Chiba, JP;

Toshiaki Fujii, Chiba, JP;

Kouji Iwasaki, Chiba, JP;

Yasuhiko Sugiyama, Chiba, JP;

Yasuyuki Takagi, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a liquid metal ion beam irradiation device for irradiating a specific portion of a samplewith a prescribed liquid metal ion beam so as to form a cross section, and a gaseous ion beam irradiation devicefor scanning a prescribed region (observation region) of the cross section using a gaseous ion beam focused to a prescribed diameter and removing a damaged layer on the prescribed region.


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