Chiba, Japan

Takashi Kaito


Average Co-Inventor Count = 1.7

ph-index = 10

Forward Citations = 248(Granted Patents)


Location History:

  • Tokyo, JP (1987 - 1996)
  • Mihama-ku, JP (2008)
  • Chiba, JP (2002 - 2014)

Company Filing History:


Years Active: 1987-2014

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23 patents (USPTO):

Title: The Innovative Contributions of Takashi Kaito

Introduction: Takashi Kaito, based in Chiba, Japan, is a prolific inventor known for his significant contributions to the field of focused ion beam technology. With a remarkable total of 23 patents, his innovative methods and devices have advanced the capabilities of atomic-level analysis and sample processing.

Latest Patents: Among his latest patents, one notable invention is the "Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same." This invention outlines a sophisticated technique for producing a sample that enables atom probe analysis. It involves creating a concave/convex structure in both a base needle and a transplantation sample piece using FIB etching, followed by a bonding process that results in a mesh-like formation.

Another significant patent is the "Composite focused ion beam device, process observation method using the same, and processing method." This innovative device features a dual ion beam irradiation system, with one system utilizing a plasma type gas ion source for processing samples, and the other employing a gas field ion source for observing the samples. This dual-system approach enhances the efficacy of sample processing and observation.

Career Highlights: Takashi Kaito has worked with leading companies in the industry, including Seiko Instruments Inc. and Sii Nanotechnology Inc. His experience in these organizations has considerably contributed to his knowledge and expertise in focused ion beam technology.

Collaborations: Throughout his career, Kaito has collaborated with prominent colleagues, such as Tatsuya Adachi and Yoshitomo Nakagawa. These partnerships have fostered a creative environment that leads to innovative results and advancements in their respective fields.

Conclusion: Takashi Kaito's dedication to innovation and excellence in the realm of focused ion beam technology is reflected in his impressive patent portfolio. With a commitment to advancing scientific research and industrial applications, his work continues to inspire future generations of inventors and researchers.

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