Company Filing History:

16 out of 223

Sii Nanotechnology Inc.

patents

1 out of 2,899

Seiko Instruments Inc

Japan Science and Technology Agency

patents

where one patent can have more than one assignee

Years Active: 2001-2013

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17 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8601608 - Cantilever for scanning probe microscope and scanning probe microscope equipped with it (2013-12-03),

2. 8214915 - Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever (2012-07-03),

3. 8161568 - Self displacement sensing cantilever and scanning probe microscope (2012-04-17),

4. 8115367 - Piezoelectric actuator provided with a displacement meter, piezoelectric element, and positioning device (2012-02-14),

5. 8058780 - Circular cylinder type piezoelectric actuator and piezoelectric element and scanning probe microscope using those (2011-11-15),

6. 8024816 - Approach method for probe and sample in scanning probe microscope (2011-09-20),

7. 7973942 - Optical displacement detection mechanism and surface information measurement device using the same (2011-07-05),

8. 7945965 - Sensor for observations in liquid environments and observation apparatus for use in liquid environments (2011-05-17),

9. 7787133 - Optical displacement-detecting mechanism and probe microscope using the same (2010-08-31),

10. 7614288 - Scanning probe microscope fine-movement mechanism and scanning probe microscope using same (2009-11-10),

11. 7614287 - Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same (2009-11-10),

12. 7605368 - Vibration-type cantilever holder and scanning probe microscope (2009-10-20),

13. 7288762 - Fine-adjustment mechanism for scanning probe microscopy (2007-10-30),

14. 7282157 - Method of manufacturing light-propagating probe for near-field microscope (2007-10-16),

15. 7241987 - Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe (2007-07-10),

Title: The Innovative Contributions of Masato Iyoki

Introduction

Masato Iyoki is a prominent inventor based in Chiba, Japan, known for his significant contributions to the field of microscopy and sensor technology. With a total of 17 patents to his name, Iyoki has made remarkable advancements that enhance the capabilities of various scientific instruments.

Latest Patents

Iyoki's latest patents include a cantilever for scanning probe microscopes and a scanning probe microscope equipped with it. This innovative microscope integrates both atomic force microscopy and near-field optical microscopy, allowing for electrochemical measurements. The design features a pointed light transmitting material coated with a metal layer, which is further insulated except at the distal end. This configuration enables the metal layer to function as a working electrode, allowing the probe to serve multiple roles in microscopy. Additionally, he has developed a cantilever capable of active bending and deformation, which includes a lever portion supported by a main body and a resistor member that generates heat to induce thermal expansion.

Career Highlights

Throughout his career, Iyoki has worked with notable companies such as Sii Nanotechnology Inc. and Seiko Instruments Inc. His work has significantly impacted the development of advanced microscopy techniques and sensor technologies.

Collaborations

Iyoki has collaborated with esteemed colleagues, including Masatsugu Shigeno and Kazutoshi Watanabe, contributing to various innovative projects and research initiatives.

Conclusion

Masato Iyoki's contributions to the field of microscopy and sensor technology exemplify the spirit of innovation. His patents and collaborative efforts continue to influence advancements in scientific instrumentation.

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