The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2007
Filed:
Aug. 03, 2005
Yuika Saito, Saitama, JP;
Takashi Murakami, Saitama, JP;
Satoshi Kawata, Saitama, JP;
Yasushi Inoue, Saitama, JP;
Kazuhito Tsukagoshi, Saitama, JP;
Masato Iyoki, Chiba, JP;
Yuika Saito, Saitama, JP;
Takashi Murakami, Saitama, JP;
Satoshi Kawata, Saitama, JP;
Yasushi Inoue, Saitama, JP;
Kazuhito Tsukagoshi, Saitama, JP;
Masato Iyoki, Chiba, JP;
Riken, , JP;
SII NanoTechnology Inc., , JP;
Abstract
In a manufacture of a probe for a scattering type near-field microscope, there is provided a method of coating, with a high reproducibility, uniform metal particles efficiently inducing a surface enhanced Raman scattering. It has been adapted such that, in the probe for the scattering type near-field microscope, one part or all of the probe due to an interaction of at least an evanescent field is coated by metal particles which don't mutually adhere and have a particle diameter of 10 nm or larger and 50 nm or smaller in radius of curvature.