The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
Jun. 30, 2011
Kiyoshi Hasegawa, Chiba, JP;
Yutaka Ikku, Chiba, JP;
Hideki Takiguchi, Chiba, JP;
SII Nanotechnology Inc., Chiba, JP;
Abstract
The X-ray fluorescence analyzer () includes: an enclosure (); a door () for putting the sample into and out of the enclosure; a height measurement mechanism () capable of measuring a height at the irradiation point; a moving mechanism control unit () for adjusting a distance between the sample and the radiation source as well as the X-ray detector based on the measured height at the irradiation point; a laser unit () for irradiating the irradiation point with a visible light laser beam; a laser start control unit () for irradiating the visible light laser beam by the laser unit () when the door is open state; and a height measurement mechanism start control unit () for starting the height measurement mechanism to measure the height at the irradiation point when the door is opened.