For the Inventor, By the Inventor

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Sunnyvale, CA, United States of America

Revera, Incorporated

USPTO Granted Patents = 21

% Expired Patents = 4.8

EPO Patents = 2

Trademarks = 5

Forward Citations = 281

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24 inventors (with patents filed for the assignee):

Bruno W Schueler (12 out of 27 patents)

David Allen Reed (10 out of 28 patents)

Michael C Kwan (5 out of 19 patents)

4. Paola deCecco (5 out of 5 patents)

5. David S Ballance (4 out of 15 patents)

6. Paul E Larson (3 out of 25 patents)

7. David G Watson (3 out of 4 patents)

8. Jeffrey Thomas Fanton (3 out of 29 patents)

9. Rodney C Smedt (3 out of 32 patents)

10. Heath A Pois (2 out of 24 patents)

11. Bruce H Newcome (2 out of 11 patents)

12. Alger C Pike (2 out of 2 patents)

13. John F Moulder (2 out of 2 patents)

14. Wei Ti Lee (1 out of 38 patents)

15. James E Orrock (1 out of 12 patents)

21 patents: Sort by Forward Citations

1. 9594035 - Silicon germanium thickness and composition determination using combined XPS and XRF technologies (2017-03-14),

2. 9588066 - Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) (2017-03-07),

3. 9297771 - Methods and systems for fabricating platelets of a monochromator for X-ray photoelectron spectroscopy (2016-03-29),

4. 9240254 - System and method for characterizing a film by X-ray photoelectron and low-energy X-ray fluorescence spectroscopy (2016-01-19),

5. 9201030 - Method and system for non-destructive distribution profiling of an element in a film (2015-12-01),

6. 8610059 - Method and system for non-destructive distribution profiling of an element in a film (2013-12-17),

7. 8269167 - Method and system for non-destructive distribution profiling of an element in a film (2012-09-18),

8. 8011830 - Method and system for calibrating an X-ray photoelectron spectroscopy measurement (2011-09-06),

9. 7996178 - Semiconductor substrate processing method and apparatus (2011-08-09),

10. 7884321 - Method and system for non-destructive distribution profiling of an element in a film (2011-02-08),

11. 7720631 - Semiconductor substrate processing method and apparatus (2010-05-18),

12. 7561438 - Electronic device incorporating a multilayered capacitor formed on a printed circuit board (2009-07-14),

13. 7456399 - Calibrating multiple photoelectron spectroscopy systems (2008-11-25),

14. 7449682 - System and method for depth profiling and characterization of thin films (2008-11-11),

15. 7420163 - Determining layer thickness using photoelectron spectroscopy (2008-09-02),

Company Overview

Revera, Incorporated, based in Sunnyvale, California, specializes in advanced technology solutions that enhance the efficiency and effectiveness of various industries. The company focuses on developing innovative software and hardware systems, particularly in the realms of cloud computing and data analytics. Revera is committed to driving progress through research and development, aiming to provide cutting-edge tools that empower businesses to optimize their operations and achieve their strategic goals.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

21 Patents

#181 in Sunnyvale, CA

#3,764 in California

#15,712 in US

#30,001 in the World

Sunnyvale, CA, United States of America

Revera, Incorporated

Forward Citations = 281

24 inventors:

Bruno W Schueler (12 out of 27 patents)

David Allen Reed (10 out of 28 patents)

Michael C Kwan (5 out of 19 patents)

4. Paola deCecco (5 out of 5 patents)

5. David S Ballance (4 out of 15 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Revera, Incorporated. Retrieved from https://idiyas.com/company/revera

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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