For the Inventor, By the Inventor

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Sunnyvale, CA, United States of America

Revera, Incorporated

USPTO Granted Patents = 21

% Expired Patents = 4.8

EPO Patents = 2

Trademarks = 5

Forward Citations = 281

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24 inventors (with patents filed for the assignee):

Bruno W Schueler (12 out of 26 patents)

David Allen Reed (10 out of 27 patents)

Michael C Kwan (5 out of 19 patents)

4. Paola deCecco (5 out of 5 patents)

5. David S Ballance (4 out of 15 patents)

6. Paul E Larson (3 out of 25 patents)

7. David G Watson (3 out of 4 patents)

8. Jeffrey Thomas Fanton (3 out of 29 patents)

9. Rodney C Smedt (3 out of 32 patents)

10. Heath A Pois (2 out of 24 patents)

11. Bruce H Newcome (2 out of 10 patents)

12. Alger C Pike (2 out of 2 patents)

13. John F Moulder (2 out of 2 patents)

14. Wei Ti Lee (1 out of 38 patents)

15. James E Orrock (1 out of 12 patents)

21 patents: Sort by Forward Citations

1. 9594035 - Silicon germanium thickness and composition determination using combined XPS and XRF technologies (2017-03-14),

2. 9588066 - Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) (2017-03-07),

3. 9297771 - Methods and systems for fabricating platelets of a monochromator for X-ray photoelectron spectroscopy (2016-03-29),

4. 9240254 - System and method for characterizing a film by X-ray photoelectron and low-energy X-ray fluorescence spectroscopy (2016-01-19),

5. 9201030 - Method and system for non-destructive distribution profiling of an element in a film (2015-12-01),

6. 8610059 - Method and system for non-destructive distribution profiling of an element in a film (2013-12-17),

7. 8269167 - Method and system for non-destructive distribution profiling of an element in a film (2012-09-18),

8. 8011830 - Method and system for calibrating an X-ray photoelectron spectroscopy measurement (2011-09-06),

9. 7996178 - Semiconductor substrate processing method and apparatus (2011-08-09),

10. 7884321 - Method and system for non-destructive distribution profiling of an element in a film (2011-02-08),

11. 7720631 - Semiconductor substrate processing method and apparatus (2010-05-18),

12. 7561438 - Electronic device incorporating a multilayered capacitor formed on a printed circuit board (2009-07-14),

13. 7456399 - Calibrating multiple photoelectron spectroscopy systems (2008-11-25),

14. 7449682 - System and method for depth profiling and characterization of thin films (2008-11-11),

15. 7420163 - Determining layer thickness using photoelectron spectroscopy (2008-09-02),

ReVera, Incorporated is a leading technology company specializing in advanced data analytics and cybersecurity solutions. With a team of experienced professionals and cutting-edge technology, we help organizations detect and prevent insider threats, intellectual property theft, and cyber attacks. Backed by our innovative software and comprehensive services, we provide actionable intelligence and real-time monitoring to safeguard critical data and protect against evolving threats. Visit our website for more information and to discover how ReVera can empower your organization's security infrastructure.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Sep 22 2026

Revera, Incorporated

21 Patents

#181 in Sunnyvale, CA

#3,753 in California

#15,662 in US

#29,874 in the World

Sunnyvale, CA, United States of America

Revera, Incorporated

Forward Citations = 281

24 inventors:

Bruno W Schueler (12 out of 26 patents)

David Allen Reed (10 out of 27 patents)

Michael C Kwan (5 out of 19 patents)

4. Paola deCecco (5 out of 5 patents)

5. David S Ballance (4 out of 15 patents)

Please report any incorrect information to [email protected]

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