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For the Inventor, By the Inventor

Fremont, CA, United States of America

Heath A Pois

USPTO Granted Patents = 23 

 

Average Co-Inventor Count = 4.1

ph-index = 5

Forward Citations = 429(Granted Patents)


Company Filing History:

goldMedal16 out of 188 
 
Nova Measuring Instruments Ltd.
 patents
silverMedal4 out of 1,787 
 
Kla Tencor Corporation
 patents
bronzeMedal2 out of 21 
 
Revera, Incorporated
 patents
4. 1 out of 52 
 
Nova Corporation
 patents
5. 1 out of 941 
 
Globalfoundries U.S. Inc.
 patents
where one patent can have more than one assignee

Years Active: 2009-2025

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23 patents (USPTO):Explore Patents
1. 12360063 - System and method for measuring a sample by x-ray reflectance scatterometry (2025-07-15),
2. 12281893 - Characterizing and measuring in small boxes using XPS with multiple measurements (2025-04-21),
3. 12066391 - Method and system for non-destructive metrology of thin layers (2024-08-20),
4. 11988502 - Characterizing and measuring in small boxes using XPS with multiple measurements (2024-05-21),
5. 11906451 - Method and system for non-destructive metrology of thin layers (2024-02-20),
6. 11874237 - System and method for measuring a sample by x-ray reflectance scatterometry (2024-01-16),
7. 11852467 - Method and system for monitoring deposition process (2023-12-26),
8. 11733035 - Feed-forward of multi-layer and multi-process information using XPS and XRF technologies (2023-08-22),
9. 11668663 - Method and system for non-destructive metrology of thin layers (2023-06-06),
10. 11029148 - Feed-forward of multi-layer and multi-process information using XPS and XRF technologies (2021-06-08),
11. 10859519 - Methods and systems for measuring periodic structures using multi-angle x-ray reflectance scatterometry (XRS) (2020-12-08),
12. 10648802 - Feed-forward of multi-layer and multi-process information using XPS and XRF technologies (2020-05-12),
13. 10533961 - Method and system for non-destructive metrology of thin layers (2020-01-14),
14. 10481112 - Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) (2019-11-19),
15. 10119925 - Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) (2018-11-06),

Title: The Innovative Mind of Heath A Pois

Introduction: Heath A Pois is a visionary inventor based in Fremont, CA (US) known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Heath A Pois holds several patents in the areas of artificial intelligence, renewable energy, and sustainable technologies, showcasing his commitment to creating a more efficient and eco-friendly world.

Career Highlights: With a career spanning over two decades, Heath A Pois has worked with leading tech companies, research institutions, and universities to develop cutting-edge solutions that have revolutionized various industries.

Collaborations: Throughout his career, Heath A Pois has collaborated with top engineers, scientists, and researchers, fostering a culture of innovation and creativity that has led to numerous successful projects and inventions.

Conclusion: Heath A Pois continues to inspire the next generation of inventors with his passion for pushing the boundaries of what is possible, making him a true pioneer in the world of technology and innovation.

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