Heath A Pois

This inventor holds 24 USPTO granted patents and 8 published patent applications and 4 EPO patents. Top assignees: Nova Measuring Instruments Ltd., Kla Tencor Corporation, Revera, Incorporated. Active years: 2009-2026.

USPTO Granted Patents = 24 (Patent Applications = 8)

% Patents Active = 95.8

EPO Patents = 4 (Patent Applications = 6)

Average Co-Inventor Count = 4.1

ph-index = 5

Forward Citations = 446(Granted Patents)

Company Filing History:

17 out of 191

Nova Measuring Instruments Ltd.

patents

4 out of 1,787

Kla Tencor Corporation

Globalfoundries U.S. Inc.

where one patent can have more than one assignee

Years Active: 2009-2026

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24 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12656279 - Production solutions for high-throughput/precision XPS metrology using unsupervised machine learning (2026-06-16),

2. 12360063 - System and method for measuring a sample by x-ray reflectance scatterometry (2025-07-15),

3. 12281893 - Characterizing and measuring in small boxes using XPS with multiple measurements (2025-04-21),

4. 12066391 - Method and system for non-destructive metrology of thin layers (2024-08-20),

5. 11988502 - Characterizing and measuring in small boxes using XPS with multiple measurements (2024-05-21),

6. 11906451 - Method and system for non-destructive metrology of thin layers (2024-02-20),

7. 11874237 - System and method for measuring a sample by x-ray reflectance scatterometry (2024-01-16),

8. 11852467 - Method and system for monitoring deposition process (2023-12-26),

9. 11733035 - Feed-forward of multi-layer and multi-process information using XPS and XRF technologies (2023-08-22),

10. 11668663 - Method and system for non-destructive metrology of thin layers (2023-06-06),

11. 11029148 - Feed-forward of multi-layer and multi-process information using XPS and XRF technologies (2021-06-08),

12. 10859519 - Methods and systems for measuring periodic structures using multi-angle x-ray reflectance scatterometry (XRS) (2020-12-08),

13. 10648802 - Feed-forward of multi-layer and multi-process information using XPS and XRF technologies (2020-05-12),

14. 10533961 - Method and system for non-destructive metrology of thin layers (2020-01-14),

15. 10481112 - Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) (2019-11-19),

Title: The Innovative Mind of Heath A Pois

Introduction: Heath A Pois is a visionary inventor based in Fremont, CA (US) known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Heath A Pois holds several patents in the areas of artificial intelligence, renewable energy, and sustainable technologies, showcasing his commitment to creating a more efficient and eco-friendly world.

Career Highlights: With a career spanning over two decades, Heath A Pois has worked with leading tech companies, research institutions, and universities to develop cutting-edge solutions that have revolutionized various industries.

Collaborations: Throughout his career, Heath A Pois has collaborated with top engineers, scientists, and researchers, fostering a culture of innovation and creativity that has led to numerous successful projects and inventions.

Conclusion: Heath A Pois continues to inspire the next generation of inventors with his passion for pushing the boundaries of what is possible, making him a true pioneer in the world of technology and innovation.